Instantaneous measurement of surface roughness spectra using white-light scattering projected on a spectrometer.

Following on from previous studies on motionless scatterometers based on the use of white light, we propose a new, to the best of our knowledge, experiment of white-light scattering that should overtake the previous ones in most situations. The setup is very simple as it requires only a broadband illumination source and a spectrometer to analyze light scattering at a unique direction. After introducing the principle of the instrument, roughness spectra are extracted for different samples, and the consistency of results is validated at the intersection of bandwidths. The technique will be of great use for samples that cannot be moved.

Immediate and one-point roughness measurements using spectrally shaped light.

Capitalizing on a previous theoretical paper, we propose a novel approach, to our knowledge, that is different from the usual scattering measurements, one that is free of any mechanical movement or scanning. Scattering is measured along a single direction. Wide-band illumination with a properly chosen wavelength spectrum makes the signal proportional to the sample roughness, or to the higher-order roughness moments. Spectral shaping is carried out with gratings and a spatial light modulator. We validate the technique by cross-checking with a classical angle-resolved scattering set-up. Though the bandwidth is reduced, this white light technique may be of key interest for on-line measurements, large components that cannot be displaced, or other parts that do not allow mechanical movement around them.

Terahertz probing of sunflower leaf multilayer organization.

We analyze the multilayer structure of sunflower leaves from Terahertz data measured in the time-domain at a ps scale. Thin film reverse engineering techniques are applied to the Fourier amplitude of the reflected and transmitted signals in the frequency range f < 1.5 Terahertz (THz). Validation is first performed with success on etalon samples. The optimal structure of the leaf is found to be a 8-layer stack, in good agreement with microscopy investigations. Results may open the door to a complementary classification of leaves.

Anisotropic Superattenuation of Capillary Waves on Driven Glass Interfaces.

Metrological atomic force microscopy measurements are performed on the silica glass interfaces of photonic band-gap fibers and hollow capillaries. The freezing of attenuated out-of-equilibrium capillary waves during the drawing process is shown to result in a reduced surface roughness. The roughness attenuation with respect to the expected thermodynamical limit is determined to vary with the drawing stress following a power law. A striking anisotropic character of the height correlation is observed: glass surfaces thus retain a structural record of the direction of the flow to which the liquid was submitted.

Nondestructive measurement of the roughness of the inner surface of hollow core-photonic bandgap fibers.

We present optical and atomic force microscopy measurements of the roughness of the core wall surface within a hollow core photonic bandgap fiber (HC-PBGF) over the [3×10-2 µm-1-30 µm-1] spatial frequency range. A recently developed immersion optical profilometry technique with picometer-scale sensitivity was used to measure the roughness of air-glass surfaces inside the fiber at unprecedentedly low spatial frequencies, which are known to have the highest impact on HC-PBGF scattering loss and, thus, determine their loss limit. Optical access to the inner surface of the core was obtained by the selective filling of the cladding holes with index matching liquid using techniques borrowed from micro-fluidics. Both measurement techniques reveal ultralow roughness levels exhibiting a 1/f spectral power density dependency characteristic of frozen surface capillary waves over a broad spatial frequency range. However, a deviation from this behavior at low spatial frequencies was observed for the first time, to the best of our knowledge.