Evaluation of Zn: WO3 Thin Films as a Sensing Layer for Detection of NH3 Gas.

Pristine WO3 and Zn-doped WO3 were synthesized using the spray pyrolysis technique to detect ammonia gas. The prominent orientation of the crystallites along the (200) plane was evident from X-ray diffraction (XRD) studies. Scanning Electron Microscope (SEM) morphology indicated well-defined grains upon Zn doping with a smaller grain size of 62 nm for Zn-doped WO3 (Zn: WO3) film. The photoluminescence (PL) emission at different wavelengths was assigned to defects such as oxygen vacancies, interstitial oxygens, localized defects, etc. X-ray Photoelectron spectroscopy (XPS) studies confirmed the formation of oxygen vacancies in the deposited films. The ammonia (NH3) sensing analysis of the deposited films was carried out at an optimum working temperature of 250 °C. The sensor performance of Zn: WO3 was enhanced compared to pristine WO3 at 1 ppm NH3 concentration, elucidating the possibility of the films in sensing applications.

Impact of Ag on the Limit of Detection towards NH3-Sensing in Spray-Coated WO3 Thin-Films.

Ag-doped WO3 (Ag-WO3) films were deposited on a soda-lime glass substrate via a facile spray pyrolysis technique. The surface roughness of the films varied between 0.6 nm and 4.3 nm, as verified by the Atomic Force Microscopy (AFM) studies. Ammonia (NH3)-sensing measurements of the films were performed for various concentrations at an optimum sensor working temperature of 200 °C. Enrichment of oxygen vacancies confirmed by X-ray Photoelectron Spectroscopy (XPS) in 1% Ag-WO3 enhanced the sensor response from 1.06 to 3.29, approximately 3 times higher than that of undoped WO3. Limit of detection (LOD) up to 500 ppb is achieved for 1% Ag-WO3, substantiating the role of Ag in improving sensor performance.

Spectroscopic investigation of Cux Mg0.2-x Zn0.8 S (x = 0, 0.05, 0.10, 0.15) thin films for deep and dilute blue LED applications.

The effect of copper (Cu) doping on the luminescent properties of the spray deposited Mg0.2 Zn0.8 S thin films were investigated for the first time. The Mg0.2 Zn0.8 S film is an excellent luminescent material with strong blue emissions. In the current investigation, we doped Mg0.2 Zn0.8 S with Cu by taking (Cu + Mg) as 20 at% by keeping other element ratios constant. Among the different samples in the series, Cu0.05 Mg0.15 Zn0.8 S has shown promising results with dark blue emission. Also, these films showed good structural formation with lower or no other impurities, which is evident from the X-ray diffraction (XRD). Scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDX) and atomic force microscopy (AFM) confirmed the improved material quality of Cu0.05 Mg0.15 Zn0.8 S as compared to the pristine. Raman and X-ray photoelectron spectroscopy (XPS) studies have been carried out for the samples. Various defects induced in the films were investigated by recording the photoluminescence (PL) spectra and Cu:(Mg0.2 Zn0.8 S) films exhibited the capability to produce dilute blue luminescence by absorbing ultraviolet (UV) light. The Cu0.05 Mg0.15 Zn0.8 S film showed promising material property, which is suitable for light-emitting diode (LED) applications.