RESUMO
The rigorous modeling of large (hundreds of wavelengths) optical resonant components patterned at a subwavelength scale remains a major issue, especially when long range interactions cannot be neglected. In this Letter, we compare the performances of the discrete dipole approximation approach to that of the Fourier modal, the finite element and the finite difference time domain methods, for simulating the spectral behavior of a cavity resonator integrated grating filter (CRIGF). When the component is invariant along one axis (two-dimensional configuration), the four techniques yield similar results, despite the modeling difficulty of such a structure. We also demonstrate, for the first time to the best of our knowledge, the rigorous modeling of a three-dimensional CRIGF.
RESUMO
Tomographic diffractive microscopy is a marker-free optical digital imaging technique in which three-dimensional samples are reconstructed from a set of holograms recorded under different angles of incidence. We show experimentally that, by processing the holograms with singular value decomposition, it is possible to image objects in a noisy background that are invisible with classical wide-field microscopy and conventional tomographic reconstruction procedure. The targets can be further characterized with a selective quantitative inversion.
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We show experimentally that a resolution far beyond that of conventional far-field optical profilometers can be reached with optical diffraction tomography. This result is obtained in the presence of multiple scattering when using an adapted inverse scattering algorithm for profile reconstruction. This new profilometry technique, whose resolution can be compared to that of atomic microscopes, also gives access to the permittivity of the surface.
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In this Letter, we give a general description of the illumination and object properties for obtaining total absorption. We show theoretically and numerically that properly designed sub-100 nm metallic particles are able to absorb all the energy of an incident beam if the latter is adequately shaped. In addition to their interest as absorbers, these particles act as efficient near-field probes as they convert the incident propagating beam into a localized nonradiative field.
RESUMO
We present a marker-free microscope that records the phase, amplitude, and polarization state of the field diffracted by the sample for different illumination directions. The data are processed with an appropriate inversion method to yield the sample permittivity map. We observe that the full-polarized information ameliorates significantly the three-dimensional image of weakly scattering subdiffraction objects. A resolution about one-fourth of the illumination wavelength is experimentally demonstrated on complex samples.
RESUMO
Tomographic diffractive microscopy is a recent imaging technique that reconstructs quantitatively the three-dimensional permittivity map of a sample with a resolution better than that of conventional wide-field microscopy. Its main drawbacks lie in the complexity of the setup and in the slowness of the image recording as both the amplitude and the phase of the field scattered by the sample need to be measured for hundreds of successive illumination angles. In this Letter, we show that, using a wavefront sensor, tomographic diffractive microscopy can be implemented easily on a conventional microscope. Moreover, the number of illuminations can be dramatically decreased if a constrained reconstruction algorithm is used to recover the sample map of permittivity.
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We demonstrate that the axial resolution of a reflection tomographic diffractive microscope is drastically improved when the sample is placed in front of a perfect mirror. We show analytically and with rigorous simulations that this approach permits us to obtain images with the same isotropic resolution as that obtained when the sample is illuminated and observed from every possible angle. The main difficulty lies in accounting properly for the mirror in the inversion algorithm.
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A review of recent advancements in photonic forces is presented. We discuss in detail the interaction of light and sub-wavelength particles on a substrate illuminated by total internal reflection, and we study the optical forces experienced by the particles. The effects of plasmon-mode excitations on the resulting photonic forces on metallic particles are also addressed. Moreover, we explore the possibility of using the metallic tip of a classical apertureless microscope to create optical tweezers, and thus to achieve a selective manipulation of nanoparticles.
Assuntos
Luz , Micromanipulação/métodos , Microscopia/métodos , Nanotecnologia/métodos , Ressonância de Plasmônio de Superfície/métodos , Micromanipulação/instrumentação , Microscopia/instrumentação , Nanotecnologia/instrumentação , Fótons , Estresse Mecânico , Ressonância de Plasmônio de Superfície/instrumentaçãoRESUMO
We establish the time-averaged total force on a subwavelength-sized particle in a time-harmonic-varying field. Our analysis is not restricted to the spatial dependence of the incident field. We discuss the addition of the radiative reaction term to the polarizability to deal correctly with the scattering force. As an illustration, we assess the degree of accuracy of several previously established polarizability models.