Terahertz probing of sunflower leaf multilayer organization.

We analyze the multilayer structure of sunflower leaves from Terahertz data measured in the time-domain at a ps scale. Thin film reverse engineering techniques are applied to the Fourier amplitude of the reflected and transmitted signals in the frequency range f < 1.5 Terahertz (THz). Validation is first performed with success on etalon samples. The optimal structure of the leaf is found to be a 8-layer stack, in good agreement with microscopy investigations. Results may open the door to a complementary classification of leaves.

A New Optical Sensor Based on Laser Speckle and Chemometrics for Precision Agriculture: Application to Sunflower Plant-Breeding.

New instruments to characterize vegetation must meet cost constraints while providing accurate information. In this paper, we study the potential of a laser speckle system as a low-cost solution for non-destructive phenotyping. The objective is to assess an original approach combining laser speckle with chemometrics to describe scattering and absorption properties of sunflower leaves, related to their chemical composition or internal structure. A laser diode system at two wavelengths 660 nm and 785 nm combined with polarization has been set up to differentiate four sunflower genotypes. REP-ASCA was used as a method to analyze parameters extracted from speckle patterns by reducing sources of measurement error. First findings have shown that measurement errors are mostly due to unwilling residual specular reflections. Moreover, results outlined that the genotype significantly impacts measurements. The variables involved in genotype dissociation are mainly related to scattering properties within the leaf. Moreover, an example of genotype classification using REP-ASCA outcomes is given and classify genotypes with an average error of about 20%. These encouraging results indicate that a laser speckle system is a promising tool to compare sunflower genotypes. Furthermore, an autonomous low-cost sensor based on this approach could be used directly in the field.

From angle-resolved ellipsometry of light scattering to imaging in random media.

A procedure is described to allow selective cancellation of polarized scattering within optical substrates and multilayers. It is shown how bulk scattering (respectively surface) can be directly eliminated while the remaining roughness (respectively bulk) signal is still measurable. The same procedure can be applied to isolate a single interface or bulk within a stack or to detect slight departure from perfect correlation within multilayers. Experiments and a procedure for selective imaging in random media are described.

Efficiency of polarimetric z probing in optical multilayers.

Numerical calculation is performed to validate the principles of a single optical technique devoted to real time probing or imaging of submultilayers within interferential coatings.