Scaling like behaviour of resistivity observed in LaNiO3 thin films grown on SrTiO3 substrate by pulsed laser deposition.

We discuss the origin of the temperature dependence of resistivity ρ observed in highly oriented LaNiO3 thin films grown on SrTiO3 substrate by a pulsed laser deposition technique. All the experimental data are found to collapse into a single universal curve ρ(T, d) ∝ [T/T(sf)(d)]3/2 for the entire temperature interval (20K