RESUMO
An approach is established for fabricating high-strength and high-stiffness composite laminates with continuous carbon nanotube (CNT) yarns for scaled-up mechanical tests and potential aerospace structure applications. Continuous CNT yarns with up to 80% degree of nanotube alignment and a unique self-assembled graphitic CNT packing result in their specific tensile strengths of 1.77 ± 0.07 N/tex and an apparent specific modulus of 92.6 ± 3.2 N/tex. Unidirectional CNT yarn reinforced composite laminates with a CNT concentration of greater than 80 wt % and minimal microscale voids are fabricated using filament winding and aerospace-grade resin matrices. A specific tensile strength of up to 1.71 GPa/(g cm-3) and specific modulus of 256 GPa/(g cm-3) are realized; the specific modulus exceeds current state-of-the-art unidirectional carbon fiber composite laminates. The specific modulus of the laminates is 2.76 times greater than the specific modulus of the constituent CNT yarns, a phenomenon not observed in carbon fiber reinforced composites. The results demonstrate an effective approach for fabricating high-strength CNT yarns into composites for applications that require specific tensile modulus properties that are significantly beyond state-of-the-art carbon fiber composites and potentially open an unexplored performance region in the Ashby chart for composite material applications.
RESUMO
Beamline 11.3.1 at the Advanced Light Source is a tender/hard (6-17 keV) x-ray bend magnet beamline recently re-purposed with a new full-field, nanoscale transmission x-ray microscope. The microscope is designed to image composite and porous materials possessing a submicrometer structure and compositional heterogeneity that determine materials' performance and geologic behavior. The theoretical and achieved resolutions are 55 and <100 nm, respectively. The microscope is used in tandem with a <25 nm eccentricity rotation stage for high-resolution volume imaging using nanoscale computed tomography. The system also features a novel bipolar illumination condenser for the illumination of an â¼100 µm spot of interest on the sample, followed by a phase-type zone plate magnifying objective of â¼52 µm field of view and a phase detection ring. The zone plate serves as the system objective and magnifies the sample with projection onto an indirect x-ray detection system, consisting of a polished single crystal CsI(Tl) scintillator and a range of high-quality Plan Fluorite visible light objectives. The objectives project the final visible light image onto a water-cooled CMOS 2048 × 2048-pixel2 detector. Here, we will discuss the salient features of this instrument and describe early results from imaging the internal three-dimensional microstructure and nanostructure of target materials, including fiber-reinforced composites and geomaterials.