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1.
Phys Chem Chem Phys ; 22(38): 21977-21987, 2020 Oct 07.
Artigo em Inglês | MEDLINE | ID: mdl-32975272

RESUMO

Coin cells are used extensively as test devices in battery research for evaluation of new materials and optimization of cycling protocols. In this study, in situ X-ray diffraction profilometry is used to characterize spatial distribution of the active materials, lithiation, and phase distribution in electrodes of NCM523/graphite coin cells. The X-ray data indicate uneven areal compression of the electrode assembly in such cells, which we trace to a specific design feature that leads to elastic deformation of a metal spacer. Steep lithiation gradients observed in the electrodes imply radially-dependent resistivity, for which uneven compression of the separator is a likely cause. Electrochemical model calculations suggest that variable porosity of the polymer separator would account for the salient features of spatial profiles observed in these coin cells.

2.
ACS Appl Mater Interfaces ; 10(4): 3487-3494, 2018 Jan 31.
Artigo em Inglês | MEDLINE | ID: mdl-29298378

RESUMO

Amorphous silicon thin films having various thicknesses were investigated as a negative electrode material for lithium-ion batteries. Electrochemical characterization of the 20 nm thick thin silicon film revealed a very low first cycle Coulombic efficiency, which can be attributed to the silicon oxide layer formed on both the surface of the as-deposited Si thin film and the interface between the Si and the substrate. Among the investigated films, the 100 nm Si thin film demonstrated the best performance in terms of first cycle efficiency and cycle life. Observations from scanning electron microscopy demonstrated that the generation of cracks was inevitable in the cycled Si thin films, even as the thickness of the film was as little as 20 nm, which was not predicted by previous modeling work. However, the cycling performance of the 20 and 100 nm silicon thin films was not detrimentally affected by these cracks. The poor capacity retention of the 1 µm silicon thin film was attributed to the delamination.

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