Reflection imaging with a helium zone plate microscope.

Neutral helium atom microscopy is a novel microscopy technique which offers strictly surface-sensitive, non-destructive imaging. Several experiments have been published in recent years where images are obtained by scanning a helium beam spot across a surface and recording the variation in scattered intensity at a fixed total scattering angle θSD and fixed incident angle θi relative to the overall surface normal. These experiments used a spot obtained by collimating the beam (referred to as helium pinhole microscopy). Alternatively, a beam spot can be created by focusing the beam with an atom optical element. However up till now imaging with a focused helium beam has only been demonstrated in transmission (using a zone plate). Here we present the first reflection images obtained with a focused helium beam (also using a zone plate). Images are obtained with a spot size (FWHM) down to 4.7µm±0.5µm, and we demonstrate focusing down to a spot size of about 1µm. Furthermore, we present experiments measuring the scattering distribution from a focused helium beam spot. The experiments are done by varying the incoming beam angle θi while keeping the beam-detector angle θSD and the point where the beam spot hits the surface fixed - in essence, a microscopy scale realization of a standard helium atom scattering experiment. Our experiments are done using an electron bombardment detector with adjustable signal accumulation, developed particularly for helium microscopy.

Sub-resolution contrast in neutral helium microscopy through facet scattering for quantitative imaging of nanoscale topographies on macroscopic surfaces.

Nanoscale thin film coatings and surface treatments are ubiquitous across industry, science, and engineering; imbuing specific functional or mechanical properties (such as corrosion resistance, lubricity, catalytic activity and electronic behaviour). Non-destructive nanoscale imaging of thin film coatings across large (ca. centimetre) lateral length scales, crucial to a wide range of modern industry, remains a significant technical challenge. By harnessing the unique nature of the helium atom-surface interaction, neutral helium microscopy images these surfaces without altering the sample under investigation. Since the helium atom scatters exclusively from the outermost electronic corrugation of the sample, the technique is completely surface sensitive. Furthermore, with a cross-section that is orders of magnitude larger than that of electrons, neutrons and photons, the probe particle routinely interacts with features down to the scale of surface defects and small adsorbates (including hydrogen). Here, we highlight the capacity of neutral helium microscopy for sub-resolution contrast using an advanced facet scattering model based on nanoscale features. By replicating the observed scattered helium intensities, we demonstrate that sub-resolution contrast arises from the unique surface scattering of the incident probe. Consequently, it is now possible to extract quantitative information from the helium atom image, including localised ångström-scale variations in topography.

Variation of bending rigidity with material density: bilayer silica with nanoscale holes.

Two dimensional (2D) materials are a young class of materials that is foreseen to play an important role as building blocks in a range of applications, e.g. flexible electronics. For such applications, mechanical properties such as the bending rigidity κ are important. Only a few published measurements of the bending rigidity are available for 2D materials. Nearly unexplored is the question of how the 2D material density influences the bending rigidity. Here, we present helium atom scattering measurements on a "holey" bilayer silica with a density of 1.4 mg m-2, corresponding to 1.7 monolayers coverage. We find a bending rigidity of 6.6 ± 0.3 meV, which is lower than previously published measurements for a complete 2D film, where a value of 8.8 ± 0.5 meV was obtained. The decrease of bending rigidity with lower density is in agreement with theoretical predictions.

Taxonomy through the lens of neutral helium microscopy.

The field of taxonomy is critically important for the identification, conservation, and ecology of biological species. Modern taxonomists increasingly need to employ advanced imaging techniques to classify organisms according to their observed morphological features. Moreover, the generation of three-dimensional datasets is of growing interest; moving beyond qualitative analysis to true quantitative classification. Unfortunately, biological samples are highly vulnerable to degradation under the energetic probes often used to generate these datasets. Neutral atom beam microscopes avoid such damage due to the gentle nature of their low energy probe, but to date have not been capable of producing three-dimensional data. Here we demonstrate a means to recover the height information for samples imaged in the scanning helium microscope (SHeM) via the process of stereophotogrammetry. The extended capabilities, namely sparse three-dimensional reconstructions of features, were showcased via taxonomic studies of both flora (Arabidopsis thaliana) and fauna (Heterodontus portusjacksoni). In concert with the delicate nature of neutral helium atom beam microscopy, the stereophotogrammetry technique provides the means to derive comprehensive taxonomical data without the risk of sample degradation due to the imaging process.