Report on the CCT Supplementary Comparison S1 of Infrared Spectral Normal Emittance/Emissivity.

The National Measurement Institutes (NMIs) of the United States, Germany, France, Italy and Japan, have joined in an inter-laboratory comparison of their infrared spectral emittance scales. This action is part of a series of supplementary inter-laboratory comparisons (including thermal conductivity and thermal diffusivity) sponsored by the Consultative Committee on Thermometry (CCT) Task Group on Thermophysical Quantities (TG-ThQ). The objective of this collaborative work is to strengthen the major operative National Measurement Institutes' infrared spectral emittance scales and consequently the consistency of radiative properties measurements carried out worldwide. The comparison has been performed over a spectral range of 2 µm to 14 µm, and a temperature range from 23 °C to 800 °C. Artefacts included in the comparison are potential standards: oxidized inconel, boron nitride, and silicon carbide. The measurement instrumentation and techniques used for emittance scales are unique for each NMI, including the temperature ranges covered as well as the artefact sizes required. For example, all three common types of spectral instruments are represented: dispersive grating monochromator, Fourier transform and filter-based spectrometers. More than 2000 data points (combinations of material, wavelength and temperature) were compared. Ninety-eight percent (98%) of the data points were in agreement, with differences to weighted mean values less than the expanded uncertainties calculated from the individual NMI uncertainties and uncertainties related to the comparison process.

High-accuracy measurements of the normal specular reflectance.

The French Laser Megajoule (LMJ) is designed and constructed by the French Commissariat à l'Energie Atomique (CEA). Its amplifying section needs highly reflective multilayer mirrors for the flash lamps. To monitor and improve the coating process, the reflectors have to be characterized to high accuracy. The described spectrophotometer is designed to measure normal specular reflectance with high repeatability by using a small spot size of 100 mum. Results are compared with ellipsometric measurements. The instrument can also perform spatial characterization to detect coating nonuniformity.

Characterization of a heat flux sensor using short pulse laser calibration.

A method to calibrate classical heat flux sensors is presented. The classical approach to measure the temperature inside a known material by using a thermocouple fails when the measurement time is very short. In this work the surface heat flux is determined by solving the inverse heat conduction problem using a noninteger identified system as a direct model for the estimation process. Using short pulse laser calibration measurements the crucial design aspects of the sensor that play a significant role when assuming one-dimensional, semi-infinite heat transfer have been accounted for. The theoretical approach as well as the calibration results are presented and comparisons to the classical approach and results from finite element modeling are shown. It is concluded that the new method ameliorate the heat flux sensor significantly and extend its application to very short measurement times.