RESUMO
The recent development of short-wavelength optics (X/EUV, synchrotrons) requires improved metrology techniques in terms of accuracy and curvature dynamic range. In this article a stitching Shack-Hartmann head dedicated to be mounted on translation stages for the characterization of X-ray mirrors is presented. The principle of the instrument is described and experimental results for an X-ray toroidal mirror are presented. Submicroradian performances can be achieved and systematic comparison with a classical long-trace profiler is presented. The accuracy and wide dynamic range of the Shack-Hartmann long-trace-profiler head allow two-dimensional characterizations of surface figure and curvature with a submillimeter spatial resolution.
RESUMO
Solid-spaced filters are composed of one or several thin wafers of excellent optical quality acting as Fabry-Perot spacer layers. We study the different steps of the design and the manufacture of filters following dense-wavelength-division-multiplexing specifications. The design method of such filters requires a tight synergy between numerical simulations and experimental characterizations to correct possible thickness errors. Experimental results of the manufacture and characterization of a three-cavity narrow-bandpass filter and of an interleaver filter are given.
RESUMO
In this paper, we introduce the principle and demonstrate the feasibility of a tunable multiple-cavity solid-spaced bandpass filter for WDM (Wavelength Division Multiplexing) applications, which uses a vernier effect since the two cavities have different thermal sensitivities. A set of specific wavelengths can be addressed in the whole C-Band by using temperature changes less than 100 degrees C. This result corresponds to a gain factor in sensitivity about 5 with respect to alternative standard thin-film configurations.
