Deflectometry encoding the measured angle in a time-dependent intensity signal.

We propose a new concept of a deflectometer, aimed to provide high accuracy measurements with high sampling rate and low noise, as required by state-of-the-art slope-measuring profilometers, like Long Trace Profilometers or Nanometer Optics Measuring instruments. For this purpose, we introduce certain modifications to the usual working principle of autocollimators so that the measured angle is not given by the displacement of the pattern captured by a CCD, but by the harmonic contents of the time-modulated intensity signal acquired by a photodiode. By doing this, the signal can be sampled not by just a few thousand pixels but by millions of samples/s.

Custom sample environments at the ALBA XPEEM.

A variety of custom-built sample holders offer users a wide range of non-standard measurements at the ALBA synchrotron PhotoEmission Electron Microscope (PEEM) experimental station. Some of the salient features are: an ultrahigh vacuum (UHV) suitcase compatible with many offline deposition and characterization systems, built-in electromagnets for uni- or biaxial in-plane (IP) and out-of-plane (OOP) fields, as well as the combination of magnetic fields with electric fields or current injection. Electronics providing a synchronized sinusoidal signal for sample excitation enable time-resolved measurements at the 500MHz storage ring RF frequency.