Candida biofilm matrix as a resistance mechanism against photodynamic therapy.

BACKGROUND: Antimicrobial photodynamic therapy (aPDT) efficiency on Candida albicans is recognized in free-floating cultures. Though, the lack of aPDT effectiveness against C. albicans organized in biofilms is still unclear. This study aimed to explore the role of the extracellular matrix (ECM) in the protection against aPDT in C. albicans biofilms. METHODS: C. albicans SN 425 wild-type and two mutant strains CNJ 2302; Δ/Δefg1 and CJN 2330; Δ/Δtec1 (ECM deficient) were used. Biofilms were grown on 24-well plates and exposed twice-daily to aPDT with 44 µM toluidine blue-O (TBO) for 5 min followed by red light (635 nm) for 1 min (87.6 J/cm²) or 2 min (175.2 J/cm2). Application of just TBO, light, 0.12% chlorhexidine, and ultrapure water were used as controls. After 48 h, biofilms were assessed for dry-weight (DW), colony forming units (CFU), extracellular DNA (eDNA), soluble and insoluble protein (SP/IP), water-insoluble (alkali-soluble) polysaccharide (ASP), water-soluble polysaccharides (WSP), and confocal scanning laser microscopy. RESULTS: The strains with ECM deficient were affected by aPDT. For the mutant strain Δ/Δefg1, aPDT significantly reduced CFU, ASP, DW, eDNA, WSP and IP when compared to NC (p<0.001) and for the Δ/Δtec1, aPDT significantly reduced CFU, eDNA, IP and SP. Whereas CFU, DW, ASP of the wild-type strain biofilms were not reduced (p>0.05). CONCLUSIONS: C. albicans strains with reduced ECM compounds were more sensitive to aPDT suggesting that the ECM may have a significant protection role from aPDT in C. albicans biofilms.

Effects of 2 polishing techniques and reglazing on the surface roughness of dental porcelain.

The aim of this study was to compare the effect of 2 polishing systems and reglazing of dental porcelain through a quantitative and qualitative analysis of surface roughness using a stylus profilometer and scanning electron microscope. Fifteen porcelain specimens (10 x 3 x 3 mm) were used. On 1 surface of each block, a layer of glaze was applied, and surface roughness (Ra) was analyzed. All specimens were ground with aluminum oxide sandpaper until the shine was removed and the resulting Ra values were obtained. Afterwards, they were randomly divided into 3 treatment groups (n = 5): Group I (GI), polished with diamond-impregnated rubber wheels; Group II (GII), polished with silicon carbide-impregnated rubber wheels; and Group III (GIII), reglazed firing procedure alone. After the treatments, new Ra measurements were done. Data were submitted to analysis of variance (ANOVA), and Tukey tests at 5%. Comparisons between ground surface and treated surface were made by paired t-test. The ground and treated Ra values (µm) were determined as follows: GI: 0.66 ± 0.14, 0.35 ± 0.06; GII: 0.60 ± 0.04, 0.09 ± 0.03; and GIII: 0.67 ± 0.05, 0.75 ± 0.24. Significant differences were found between the ground and treated values for all groups. After the treatments, all groups differed statistically (P < 0.05). The silicon carbide system re-established the initial surface smoothness, while polishing with diamond-impregnated rubber or reglazing alone were not able to achieve a satisfactory smoothness.