Evanescent-field-induced second harmonic generation by noncentrosymmetric nanoparticles.

We demonstrate the excitation of second harmonic radiation of noncentrosymmetric nanoparticles dispersed on a planar optical waveguide by the evanescent field of the guided mode. Polarization imaging reveals information on the orientation of the crystal axis of individual nanoparticles. Interference patterns generated from adjacent particles at the second harmonic frequency are--to the authors knowledge--observed for the first time. The actual form of the interference pattern is explained on the basis of a dipole radiation model, taking into account the nanoparticles' orientation, surface effects, and the characteristics of the imaging optics.

Direct light-coupling to thin-film waveguides using a grating-structured GRIN lens.

We present a novel coupling scheme using a collimating gradient-index (GRIN) element provided with a high frequency grating to couple light from a single mode optical fiber directly to planar thin-film waveguides. The waveguide devices are used, for example, for an efficient fluorescence excitation in biosensor applications. The external coupler can be multiply reused and supersedes the conventional internal gratings. FEM simulations and experimental results show that the new technique can provide similar coupling efficiencies as common internal grating couplers.

Measurement of random processes at rough surfaces with digital speckle correlation.

We present a detailed investigation of digital speckle correlation to measure small changes in the microstructure of random rough surfaces. The corresponding alterations in the scattered-light field are recorded by an electronic camera with subsequent numerical correlation. Among the classical theoretical approaches to describe the scattering at random rough surfaces, the composite-roughness model is advanced to calculate the speckle correlation in terms of parameters of the changes in surface microstructure. For an experimental verification, surfaces with similar microstructure are fabricated with a photolithographic technique. They are employed for comparative measurements with high-resolution scanning force microscopy and for correlation measurements under variation of experimental parameters. A good agreement between theoretically predicted and experimental correlation data can be observed. The results allow a quantitative whole-field monitoring of surface processes by remote optical means.

Three-dimensional deformation field measurement with digital speckle correlation.

Digital speckle correlation is based on a detailed analysis of changes in speckle images that are recorded from laser-illuminated rough surfaces. The two in-plane components are obtained by cross-correlation of corresponding subimages, a method also known as digital speckle photography. The local gradient of the hitherto inaccessible out-of-plane component is determined from the characteristic dependence of the speckle correlation on the spatial frequency. A detailed experimental study is carried out to analyze the new technique for systematic and random measuring errors. For moderate decorrelation the accuracy of the out-of-plane measurement is better than lambda/10 and thus comparable with interferometric techniques. Yet the extremely simple and robust optical setup is suited to nondestructive-testing applications in harsh environments. The quality of the deformation maps is demonstrated in a practical application.