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1.
J Chem Phys ; 146(8): 081102, 2017 Feb 28.
Artigo em Inglês | MEDLINE | ID: mdl-28249441

RESUMO

We report on progress towards a neutral atom imaging device that will be used for chemically sensitive surface microscopy and nanofabrication. Our novel technique for improving refractive power and correcting chromatic aberration in atom lenses is based on a fundamental paradigm shift from continuous-beam focusing to a pulsed, three-dimensional approach. Simulations of this system suggest that it will pave the way toward the long-sought goal of true atom imaging on the nanoscale. Using a prototype lens with a supersonic beam of metastable neon, we have imaged complex patterns with lower distortion and higher resolution than has been shown in any previous experiment. Comparison with simulations corroborates the underlying theory and encourages further refinement of the process.

2.
J Chem Phys ; 139(9): 096103, 2013 Sep 07.
Artigo em Inglês | MEDLINE | ID: mdl-24028135

RESUMO

The inhomogeneous magnetic field of a permanent-magnet planar Halbach array is used to either deflect or to specularly reflect a supersonic beam of neutral atoms. Metastable neon and helium beams are tested to experimentally evaluate the performance of this array in a range of configurations. Results are compared with numerical simulations and the device is presented as a high precision tool for the manipulation of neutral atom beams.

3.
ACS Nano ; 7(5): 4378-83, 2013 May 28.
Artigo em Inglês | MEDLINE | ID: mdl-23544794

RESUMO

We present a scheme for imaging of neutral atoms to the nanoscale with a pulsed magnetic lens and show its viability through numerical calculations. This scheme achieves focal lengths on the order of several centimeters and focal spots of less than 10 nm. With these results, it is possible to create sub-10 nm structures on surfaces in a parallel and time-efficient manner. When used with metastable noble gas atoms, and in combination with electron spectroscopy, this scheme can create a chemically sensitive microscope which can probe surfaces on the nanometer scale.

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