RESUMO
Silver nanorods arrays (AgNRs) prepared by oblique angle deposition were characterized by the generalized ellipsometry method in the spectral range from 370 to 950 nm. Three structure models were used to fit the ellipsometry data, the uniaxial model, the biaxial orthorhombic model, and the biaxial monoclinic model. Unlike the uniaxial model reported in most literature, the biaxial models are found to give better fitting results. The optical properties along the three principle axes are different: along long axis it displays predominantly metallic behavior; along one short axis it approaches to a lossless dielectric while along the other it behaves as an absorbance dielectric. The AgNRs also demonstrate epsilon-near-zero property with the real part of dielectric constant along the rod being very close to zero at wavelength of 416 nm, which is expected to be tuned with changing of the vapor incident angles.
RESUMO
Total internal reflection (TIR) is useful for interrogating physical and chemical processes that occur at the interface between two transparent media. Yet prism-coupled TIR imaging microscopes suffer from limited sensing areas due to the fact that the interface (the object plane) is not perpendicular to the optical axis of the microscope. In this paper, we show that an electrically tunable lens can be used to rapidly and reproducibly correct the focal length of an oblique-incidence scanning microscope (OI-RD) in a prism-coupled TIR geometry. We demonstrate the performance of such a correction by acquiring an image of a protein microarray over a scan area of 4 cm² with an effective resolution of less than 20 microns. The electronic focal length tuning eliminates the mechanical movement of the illumination lens in the scanning microscope and in turn the noise and background drift associated with the motion.
