RESUMO
This paper presents an experimental investigation of the possibility of transverse resolution improvement combined with effective numerically focused 3D imaging in full-field swept-source optical coherence microscopy (OCM) by using structured illumination and specific numerical post-processing. The possibility of transverse resolution improvement of the OCM coherence signal combined with the possibility of numerical focusing is demonstrated by imaging a resolution test target in the optical focus and defocus regions. The possibility of numerically focused 3D imaging with high transverse resolution is further demonstrated by imaging a 3D phantom and a biological sample. The results obtained demonstrate the feasibility and prospects of the combination of structured illumination and numerical focusing in Fourier domain OCM.
RESUMO
A big problem in low-coherence interference microscopy is the degradation of the coherence signal caused by shift of the angular and temporal spectrum gates. It limits the depth of field in confocal optical coherence microscopy and degrades images of sample inner structure in most interference microscopy techniques. To overcome this problem we propose numerical correction of the coherence gate in application to full-field swept-source interference microscopy. The proposed technique allows three-dimensional sample imaging without mechanical movement of the microscope components and is also capable of determining separately the geometrical thickness and the refractive index of the sample layers, when the sample contains a transversal pattern. The applicability of the proposed technique is verified with numerical simulation.
