RESUMO
In the present research, heterojunctions comprised of n-type Si wafer substrates and B-doped p-type ultrananocrystalline diamond/hydrogenated amorphous carbon composite films were produced successfully by using pulsed laser deposition. Their alternating current impedance characteristics, under various frequencies, were measured and studied as a function of temperature in the range 200 to 400 K. Both the real (Z') and imaginary (Zâ³) parts of the complex impedance were temperature dependent. It was apparent that the Zâ³-Z' curve for all temperatures exhibited single semicircles. The center of these semicircles was below the Z' axis. With temperature increment, the diameter of the semicircles decreased. The characteristics of the semicircular curve indicated that the parallel resistance (Rp) and constant phase element (CPE) in parallel combination with the series resistance (Rs) should be appropriate for the equivalent electrical circuit model for the produced heterojunctions. Through simulation, the value of Rs at 200 K was found to be 5.04×10³ Ω, and fell to 252.05 Ω at 400 K. Also, the value of Rp was 1.34×107 Ω at 200 K and decreased to 3.37×105 Ω at 400 K. Moreover, the value of CPE at 200 K was 95.91×10-12 F with a deviation from the standard (n) value of 0.90 and rose slightly to 115.60×10-12 F with an n value of 0.98 at 400 K.
RESUMO
n-Type Si/p-type B-doped ultrananocrystalline diamond heterojunction photodiodes were built using pulsed laser deposition at a heated substrate temperature of 550 °C. Following the capacitance-voltage-frequency (C-V -f) and conductance-voltage-frequency (G-V -f) plots, the series resistance (Rs) values at zero bias voltage were 154.41 Ω at 2 MHz and 1.72 kΩ at 40 kHz. Rs should be ascribed to Rs occurring in the metallic contact and the bulk resistance in the active layer. At 40 kHz, the interface state density (nss) was 1.78 x 1013 eV-1 cm-2 and dropped exponentially to 1.39 x 1012 eV-1 cm-2 at 2 MHz. An assessed nss occurring at the heterojunction interface was the cause of deterioration in the photo-detection properties. At different V values, the appearance of the real (Z') and imaginary (Z'') characteristic curves revealed single semicircles whose centers lay below the Z' axis. The magnitude of the curve was diminished with the increment of V. The particularities of Z''-Z' plots can be identified as an equivalent circuit model. The appropriate model included Rs, which was combined with the parallel circuit of resistance and constant phase element.
RESUMO
In the current research, heterojunctions comprising p-type ultrananocrystalline diamond/hydrogenated amorphous carbon composite (UNCD/a-C:H) films and n-type Si substrates were formed via pulsed laser deposition. To extract their junction parameters via thermionic emission (TE) theory and Norde model, the measurement of dark current density-voltage curves was carried out under various temperatures ranging from 300 to 60 K. Through TE theory, the ideality factor values at 300 K and 60 K were 2.70 and 8.66, respectively. This justified that a heavy recombination process occurs at the junction interface in addition to another tunneling process at 300 K. The tunneling process is predominant at low temperatures. The barrier height values were 0.78 eV and 0.18 eV at 300 K and 60 K, respectively. The values for series resistance (Rs) calculated via Norde model at 300 K and 60 K were 275.24 Ω and 78.66 kΩ, respectively. The increment of Rs at low temperatures was likely due to the decrease of carrier concentration in the B-doped UNCD/a-C:H films when temperature was decreased.
