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Opt Lett ; 22(23): 1745-7, 1997 Dec 01.
Artigo em Inglês | MEDLINE | ID: mdl-18188352

RESUMO

The second-order nonlinear optical coefficients d(33) , d(31) , and d(15) of KTa(0.52) Nb(0.48) O(3) epitaxial thin films grown upon MgO were studied by the standard Maker fringe method of an anisotropic medium. The measured d(33)=-84pm/V is 2.8 times the d(33) of LiNbO(3). The refractive indices n(e) and n(o) at several wavelengths were determined by TE and TM waveguide mode measurements. The data presented here point out the excellent qualities of KTa(1-x) Nb(x)O (3) films for use in integrated optics applications.

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