Self-assembly of biaxial discorectangular lead carbonate nanosheets into stacked ribbons studied by SAXS and HAADF-STEM tomographic tilt series.

The self-assembling behaviour of 2.6 nm thin PbCO3 nanoplatelets with discorectangular shape and uniform width and thickness occurring after their formation in nonionic water-in-oil microemulsions has been investigated using synchrotron small angle X-ray scattering (SAXS) and (scanning) transmission electron microscopy ((S)TEM). The presence of attractive depletion forces originating from the ubiquitous microemulsion droplets triggers a new type of superstructure at low particle concentration. Instead of the universally observed formation of face-to-face assembled lamellar mesostructures, the nanosheets self-organise into extended ribbon structures, whereby each on top lying sheet is displaced by a constant shift in the length and width directions leading to a so far unprecedented staggered zigzag-type stack assembly with restricted height. This type of stacking gives rise to a complex interference pattern in the isotropic small angle scattering of the stacked ribbon assemblies (SRAs) in reverse micellar solution. Different to the, for lamellar-structured nanosheets typical, diffraction peaks at multiples of the wave vector corresponding to one particular repeat distance, the scattering peaks measured in this study are asymmetric, displaying a shoulder on their low wave vector side. The asymmetric shape of the observed face-to-face correlation peaks indicates that the SRAs do not extend in one direction only. Their scattering behaviour is analysed by expanding the Kratky-Porod structure factor for stacking plates into three dimensions. High-angle annular dark-field (HAADF)-STEM tilt series have complementary been acquired to retrieve three-dimensional structural information on the SRAs in the dry state and to confirm the model used for the refinement of the SAXS data.

StripeSTEM, a technique for the isochronous acquisition of high angle annular dark-field images and monolayer resolved electron energy loss spectra.

A technique capable of producing monolayer resolved electron energy loss (EEL) spectroscopy data along one direction in crystal structures is introduced. Unambiguous assignment of EEL spectra to atomic planes is possible via the execution of high angle annular dark-field (HAADF) imaging and EEL spectrum acquisition in parallel. The recording of instrumental instabilities in the HAADF image during the measurement enables a proper quantification by virtue of post-acquisition correction. Compared to the conventional line profile technique a dose reduction by several orders of magnitude can be achieved. The technique is applied to bulk SrTiO(3) and ZnO:In(2)O(3) in order to explore its capabilities and limits. Monolayer resolution was achieved for the Ti-L(23) and In-M(45) core-losses. Multislice calculations were carried out for the purpose of assessing the residual delocalisation of the inelastic signal. Fundamental limits to the resolution are imposed by dynamical dispersion of the electron wave in the crystal combined with the extension of the inelastic potential. In the present case, owing to the requirement of a high beam current, the geometrical probe size cannot be neglected when compared to the width of an inelastic scattering potential.