Direct measurement of the percolation probability in carbon nanofiber-polyimide nanocomposites.

We present the first experimental measurement of the geometric critical exponent beta associated with the percolation probability, the probability a metallic filler belongs to the conducting network, of an electrical composite. The technique employs conducting-tip atomic force microscopy to obtain a conducting areal density, and is demonstrated on polyimide nanocomposites containing different concentrations of carbon nanofibers. We find beta approximately 1 and t (the exponent for bulk conductivity) approximately 3. These values are consistent with the predictions for the Bethe lattice and larger than the values predicted in the 3D lattice percolation model. Hence, this electrical composite likely belongs to the same universality class as the Bethe lattice. The ability to measure geometric and transport critical exponents on the same material is critical to drawing this conclusion.

Near-field scanning optical microscopy imaging of multimode interference.

By use of a near-field scanning optical microscope (NSOM) in collection mode, the intensity distribution along a 2 x 2 multimode interference coupler was directly imaged as a function of wavelength. Although calculations can predict the general trend of wavelength dependence and the approximate positions of multiple images in the coupler, the accuracy is poor because of uncertainties in the waveguide width. We show that direct imaging using a NSOM bypasses calculational uncertainties and proves to be a powerful technique for studying these waveguide devices.

Direct imaging of multimode interference in a channel waveguide.

By use of a near-field scanning optical microscope in collection mode, multimode interference was directly measured in an annealed proton-exchanged LiNbO3 waveguide. Periodic transitions from a single-peaked Gaussianlike intensity distribution to a double-peaked intensity distribution were observed. The intensity distribution along the waveguide was calculated, and the results agree well with the experimental observation.

Local imaging of photonic structures: image contrast from impedance mismatch.

Photonic structures made from square arrays of air holes in Si(3)N(x) membranes are locally imaged by near-field optical microscopy in illumination mode. Holes with diameters smaller than and larger than the wavelength of light are investigated. Counterintuitively, the holes appear dark and the film is bright in transmission images for both hole sizes. Modeling shows that the dominant contrast mechanism is enhanced light emission from the tip when the tip is above the film. Tip emission is enhanced because the tip-air impedance mismatch is reduced when the tip is above the high-index film.