Quantitative characterization of built-in potential profile across GaAs p-n junctions using Kelvin probe force microscopy with qPlus sensor AFM.

The electrostatic potential distribution in materials and devices plays an important role in controlling the behaviors of charge carriers. Kelvin probe force microscopy (KPFM) is a powerful technique for measuring the surface potential at a high spatial resolution. However, the measured surface potential often deviates from the potential deep in the bulk owing to certain factors. Here, we performed KPFM measurements across the p-n junction, in which such factors were eliminated as much as possible by selecting the sample, force sensor, and measurement mode. The measured surface potential distribution agrees well with the line shape of the simulated bulk potential. Our results demonstrate that KPFM is capable of quantitatively characterizing potential distributions whose changes occur on the order of 10 nm.

Mapping stress inside living cells by atomic force microscopy in response to environmental stimuli.

The response of cells to environmental stimuli, under either physiological or pathological conditions, plays a key role in determining cell fate toward either adaptive survival or controlled death. The efficiency of such a feedback mechanism is closely related to the most challenging human diseases, including cancer. Since cellular responses are implemented through physical forces exerted on intracellular components, more detailed knowledge of force distribution through modern imaging techniques is needed to ensure a mechanistic understanding of these forces. In this work, we mapped these intracellular forces at a whole-cell scale and with submicron resolution to correlate intracellular force distribution to the cytoskeletal structures. Furthermore, we visualized dynamic mechanical responses of the cells adapting to environmental modulations in situ. Such task was achieved by using an informatics-assisted atomic force microscope (AFM) indentation technique where a key step was Markov-chain Monte Carlo optimization to search for both the models used to fit indentation force-displacement curves and probe geometry descriptors. We demonstrated force dynamics within cytoskeleton, as well as nucleoskeleton in living cells which were subjected to mechanical state modulation: myosin motor inhibition, micro-compression stimulation and geometrical confinement manipulation. Our results highlight the alteration in the intracellular prestress to attenuate environmental stimuli; to involve in cellular survival against mechanical signal-initiated death during cancer growth and metastasis; and to initiate cell migration.

Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy.

In electrochemical measurements, monitoring the electrode potential using a stable reference is essential for controlling the redox reactions that occur at the electrodes. In Kelvin probe force microscopy (KPFM) measurements on electrochemical cells, the surface potential is generally measured relative to electrical ground instead of a stable reference. Here, we show that the changes in the surface potential, measured using KPFM relative to the surface potential in the electrolyte region, is consistent with the changes in the electrode potential measured using a voltmeter relative to a reference electrode. These results demonstrate that the surface potential in the electrolyte region can be utilized as a stable potential reference when analyzing KPFM data.

Internal potential mapping of charged solid-state-lithium ion batteries using in situ Kelvin probe force microscopy.

Solid-state-lithium ion batteries (SS-LIBs) are a promising candidate for next-generation energy storage devices. Novel methods for characterizing electrochemical reactions occurring during battery operation at the nanoscale are highly required for understanding the fundamental working principle and improving the performance of the devices. In this work, we combined Ar ion milling under non-atmospheric conditions with in situ cross-sectional Kelvin probe force microscopy (KPFM) for direct imaging of the internal electrical potential distribution of the SS-LIBs. We succeeded in the direct visualization of the change in the potential distribution of a cathode composite electrode (a mixture of the active materials, solid electrolytes, and conductive additives) arising from battery charging (electrochemical reaction). The observed results provided several insights into battery operation, such as the behavior of Li ions and inhomogeneity of electrochemical reactions in the electrode. Our method paves the way to characterize the fundamental aspects of SS-LIBs for the improvement of device performance, including the evaluation of the distribution of the Li ion depleted regions, visualization of the conductive paths, and analysis of the cause of degradation.

Direct visualization of the N impurity state in dilute GaNAs using scanning tunneling microscopy.

The interaction between nitrogen (N) impurity states in III-V compounds plays a key role in controlling optoelectronic properties of the host materials. Here, we use scanning tunneling microscopy to characterize the spatial distribution and electronic properties of N impurity states in dilute GaNAs. We demonstrated that the N impurity states can be directly visualized by taking empty state current images using the multipass scanning method. The N impurity states broadened over several nanometers and exhibited a highly anisotropic distribution with a bowtie-like shape on the GaAs(110) surface, which can be explained by anisotropic propagation of strain along the zigzag chains of Ga and As atoms in the {110} plane. Our experimental findings provide strong insights into a possible role of N impurity states in modifying properties of the host materials.

SPM characterization of next generation solar cells under light irradiation: Optoelectronic study from nano to macroscopic scale.

Solar cells (SCs) that contain elaborate nanostructures, such as quantum dots and quantum wells, have been rigorously investigated as a way to harvest a wide range of the solar spectrum [1]. However, the energy conversion efficiency of those SCs still remains low. For the further improvement of the device performance, a much deeper understanding of the role of nanostructures in the photovoltaic conversion process is essential to gain the effective design criteria. To achieve this, local electronic properties including electrical potential, energy states, and charge distribution around the excitation centers have to be characterized under light irradiation since they govern the behavior of excited carriers. These properties have so far been indirectly deduced from macroscopic characterization such as current-voltage (I-V) measurement; however, it is not sufficient to clarify rather complicated roles of the nanostructures [2]. Thus, a direct measurement of those properties with high spatial resolution is required to understand the detailed mechanisms of the photovoltaic conversion process. To this end, we have been developing a platform for performing scanning tunneling microscopy/spectroscopy (STM/STS), atomic force microscopy (AFM), and Kelvin probe force microscopy (KPFM) working under light irradiation conditions.Here, we outline the characterization of a multiple quantum well (QW) SC based on III-V compounds that is expected to be a potential candidate of intermediate band type SC. First, we show the electrical potential measurements along the p-i-n junction of the SC using KPFM in air. Measurements were performed in open and short circuit configurations under light irradiation conditions [Fig.1]. We demonstrate that the dependence of the open circuit voltage on the intensity of light can be successfully measured by careful interpretation of the KPFM data. Second, we introduce some examples of the atomic scale characterization of the multiple QW using ultrahigh vacuum STM including the atomic arrangement, electronic states, and band profile. Also, charge accumulation at the QW is discussed based on the topographic measurement under light irradiation.jmicro;63/suppl_1/i12/DFU042F1F1DFU042F1Fig. 1.(a) Schematic illustration of measurement system of KPFM in air. (b) Effect of light irradiation on potential profile in open circuit configuration.

Isotropic photo-decomposition of spherical organic polymers on rutile TiO2(110) surfaces.

We observed the photo-decomposition process of polystyrene latex (PSL) spheres on a rutile TiO2(110) single crystal surface by using atomic force microscopy. During the decomposition process, both the height and width of the PSL spheres linearly decreased with the irradiation time in a similar way from the beginning, suggesting that the PSL spheres are isotropically decomposed. This indicates that the interface between the PSL spheres and the TiO2 surface is not a dominant reaction site, as expected from normal photocatalytic reactions.

Holders for in situ treatments of scanning tunneling microscopy tips.

We have developed holders for scanning tunneling microscopy tips that can be used for in situ treatments of the tips, such as electron bombardment (EB) heating, ion sputtering, and the coating of magnetic materials. The holders can be readily installed into the transfer paths and do not require any special type of base stages. Scanning electron microscopy is used to characterize the tip apex after EB heating. Also, spin-polarized scanning tunneling spectroscopy using an Fe coated W tip on the Cr(001) single crystal surface is performed in order to confirm both the capability of heating a tip up to about 2200 K and the spin sensitivity of the magnetically coated tip.