RESUMO
Monoisotopic scandium yttrium oxyorthosilicate crystals as a material for quantum memory storage with high optical quality were grown by the Czochralski method. This material, of composition Sc1.368Y0.632SiO5, is characterized by congruent melting and a melting point 60â K below the temperature for the ideal solid-solution series Y2SiO5-Sc2SiO5. The structure of the crystals was refined on the basis of high-quality single-crystal X-ray diffraction data. Sc1.368Y0.632SiO5 belongs to B-type RE2SiO5 (space group C2/c). Scandium and yttrium cations are distributed among two 8f sites with coordination numbers 7 and 6 for which the occupancy parameters ratios Sc:Y and average bond lengths are, respectively, 0.473:0.527 and RE1-O = 2.305â (2)â Å, and 0.895:0.105 and RE2-O = 2.143â (2)â Å. It is shown that the character of the occupancy of the positions of the cations with coordination numbers (CN) 6 and 7 for these solid solutions can be approximated by a polynomial dependence, the magnitude of the coefficients of which depends on the difference in the ionic radii of the cations. A preliminary electron paramagnetic resonance (EPR) study shows that activator ions with a large ionic radius at a concentration less than 0.1% occupy a position with CN = 7.
RESUMO
The nature of nanocrystalline inclusions and dopant distribution in bismuth-doped silicate fibers and preforms are studied by scanning and transmission electron microscopy, and energy and wavelength-dispersive X-ray microanalysis. The core compositions are Bi:SiO2, Bi:Al2O3-SiO2, Bi:GeO2-SiO2, Bi:Al2O3-GeO2-SiO2, and Bi:P2O5-Al2O3-GeO2-SiO2. Nanocrystals of metallic Bi, Bi2O3, SiO2, GeO2, and Bi4(GeO4)3 are observed in these glasses. These inclusions can be the reason for the background optical loss in bismuth-doped optical fibers. The bismuth concentration of 0.0048±0.0006 at% is directly measured in aluminosilicate optical fibers with effective laser generation (slope efficiency of 27% at room temperature).