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1.
J Appl Crystallogr ; 55(Pt 4): 787-812, 2022 Aug 01.
Artigo em Inglês | MEDLINE | ID: mdl-35974720

RESUMO

In the analysis of neutron scattering measurements of condensed matter structure, it normally suffices to treat the incident and scattered neutron beams as if composed of incoherent distributions of plane waves with wavevectors of different magnitudes and directions that are taken to define an instrumental resolution. However, despite the wide-ranging applicability of this conventional treatment, there are cases, such as specular neutron reflectometry, in which the structural length scales of the scattering object require that the wavefunction of an individual neutron in the beam be described by a spatially localized packet - in particular with respect to the transverse extent of its wavefronts (i.e. normal to the packet's mean direction of propagation). It is shown in the present work that neutron diffraction patterns observed for periodic transmission phase gratings, as well as specular reflection measurements from patterned thin films with repeat units of the order of micrometres, can be accurately described by associating an individual neutron with a wave packet and treating a beam as a collection of independent packets. In these cases, accurate analysis requires that the transverse spatial extent of a neutron packet wavefront be accounted for in addition to the angular divergence of the beam that is characterized by a distribution of packet mean wavevector directions. It is shown how a measure of the effective transverse spatial extent of the neutron packet - over which its wavefronts are of sufficient uniformity to produce coherent scattering - can be determined by employing reference diffraction gratings and patterned thin films of known structure and composition.

2.
Appl Opt ; 39(19): 3333-7, 2000 Jul 01.
Artigo em Inglês | MEDLINE | ID: mdl-18349901

RESUMO

An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x rays. It uses the Kirkpatrick-Baez multilayer mirror design to form an image that has a demonstrated resolution of 4 microm at 8 keV (Cu K(alpha) radiation). This microscope performs well with standard sealed-tube laboratory x-ray sources, producing digital images with 20-s exposure times for a 5-microm Au grid (a thickness of two absorption lengths).

7.
Phys Rev B Condens Matter ; 42(8): 5399-5402, 1990 Sep 15.
Artigo em Inglês | MEDLINE | ID: mdl-9996121
8.
Phys Rev B Condens Matter ; 40(8): 5557-5560, 1989 Sep 15.
Artigo em Inglês | MEDLINE | ID: mdl-9992589
10.
Phys Rev B Condens Matter ; 39(9): 5739-5747, 1989 Mar 15.
Artigo em Inglês | MEDLINE | ID: mdl-9948987
11.
Phys Rev Lett ; 60(11): 1010-1013, 1988 Mar 14.
Artigo em Inglês | MEDLINE | ID: mdl-10037918
12.
Phys Rev Lett ; 57(19): 2399-2402, 1986 Nov 10.
Artigo em Inglês | MEDLINE | ID: mdl-10033715
13.
Environ Sci Technol ; 18(1): 58-61, 1984 Jan 01.
Artigo em Inglês | MEDLINE | ID: mdl-22299844
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