Current induced surface diffusion on a single-crystalline silver nanowire.

Scanning tunnelling microscopy was used to study the morphological changes of the surface of a single-crystalline silver nanowire caused by a lateral electron current. At current densities of about 1.5 × 10(7) A cm(-2), surface atoms are extracted from step edges, resulting in the motion of surface steps, islands and holes with a thickness or depth of one monolayer. Upon current reversal the direction of the material transport can be altered. The findings are interpreted in terms of the wind force.

Electronic transport on the nanoscale: ballistic transmission and Ohm's law.

If a current of electrons flows through a normal conductor (in contrast to a superconductor), it is impeded by local scattering at defects as well as phonon scattering. Both effects contribute to the voltage drop observed for a macroscopic complex system as described by Ohm's law. Although this concept is well established, it has not yet been measured around individual defects on the atomic scale. We have measured the voltage drop at a monatomic step in real space by restricting the current to a surface layer. For the Si(111)-( [see text]3 x [see text]3)-Ag surface a monotonous transition with a width below 1 nm was found. A numerical analysis of the data maps the current flow through the complex network and the interplay between defect-free terraces and monatomic steps.

Electromigration and potentiometry measurements of single-crystalline Ag nanowires under UHV conditions.

We report on in situ electromigration and potentiometry measurements on single-crystalline Ag nanowires under ultra-high vacuum (UHV) conditions, using a four-probe scanning tunnelling microscope (STM). The Ag nanowires are grown in place by self-organization on a 4° vicinal Si(001) surface. Two of the four available STM tips are used to contact the nanowire. The positioning of the tips is controlled by a scanning electron microscope (SEM). Potentiometry measurements on an Ag nanowire were carried out using a third tip to determine the resistance per length. During electromigration measurements current densities of up to 1 × 10(8) A cm(-2) could be achieved. We use artificially created notches in the wire to initiate electromigration and to control the location of the electromigration process. At the position of the notch, electromigration sets in and is observed quasi-continuously by the SEM.