Tracking sub-nanometer thermal structural changes with speckle interferometry.

Based on our results of the James Webb Space Telescope (JWST) center-of-curvature tests where we were able to measure dynamic amplitudes of Zernike terms to the order of a few picometers, we have applied the same approach to determine if it is possible to measure the accuracy of higher-order Zernike terms as a function of time rather than frequency, i.e., static measurements in place of measuring the amplitude of frequency components. We have applied this approach to data taken for the JWST backplane structure test article (BSTA) in 2006 and find that we can measure effects at the sub-nanometer level, as small as 50 pm for Zernike terms over 30. We conclude that these results show it will be possible to use these techniques to ensure that the optics and support structure for large space telescopes can meet the necessary stability requirements for detecting spectral signatures of life on Earth-like extra-solar planets.

Sub-picometer dynamic measurements of a diffuse surface.

Future space observatory missions are forecasting the need for sensing and controlling wavefront error and system alignment stability to picometer scale. Picometer stability performance demands precision knowledge of the mirror and metering structure materials to the same degree. A high-speed electronic speckle pattern interferometer was designed and built to demonstrate measurements of both static and dynamic responses of picometer amplitudes in materials of diffuse surface subjected to very low energy disturbances. This paper describes the details of a test to impart a dynamic disturbance of picometer scale and measure the response of a composite material. The results of the test are also reported and show conclusively that sub-picometer scale effects can be accurately measured in an open test environment outside a vacuum chamber.

Measurement of picometer-scale mirror dynamics.

A high-speed interferometer has been designed and built to measure the dynamics of the James Webb Space Telescope primary mirror system currently under testing. This interferometer is capable of tracking large absolute motion (i.e., piston) of the mirror's entire surface over orders of magnitudes of wavelengths displacement. Preliminary tests have shown it to be capable of measuring dynamic effects on the level of tens of picometers reliably. This paper reports the details of test setup to do so, the data system used to collect and process the data, and the algorithms to distill the dynamics motions detected. The results that were obtained are presented and followed by a discussion of the conclusions and potential applications of this measurement technique.

Removal of a protective coating on Al by ion etching for high reflectance in the far ultraviolet.

The effect of ion etching on the reflectance of Al coatings in the far ultraviolet is investigated. Ion etching of an overlayer grown on Al was performed by applying 100-300 eV Ar(+) ions using an ion gun. Ion etching was employed to remove the oxide naturally grown on an Al film that had been in contact with atmosphere. Ion etching was also used to remove part or all of the protective MgF(2) film on Al. The reflectance at 121.6 nm, H Lyman alpha line of the overlayer-removed Al surface was monitored after protecting it with a MgF(2) layer. Ion etching on both types of coatings resulted in an excellent reflectance value at 121.6 nm, whereas a reflectance loss was observed at longer wavelengths.

Measurement of large cryogenic structures using a spatially phase-shifted digital speckle pattern interferometer.

The James Webb Space Telescope (JWST) Backplane Stability Test Article (BSTA) was developed to demonstrate large precision cryogenic structures' technology readiness for use in the JWST. The thermal stability of the BSTA was measured at cryogenic temperatures at the Marshall Space Flight Center (MSFC) X-Ray Calibration Facility (XRCF) and included nearly continuous measurements over a six-week period in the summer of 2006 covering the temperature range from ambient down to 30 Kusing a spatially phase-shifted digital speckle pattern interferometer (SPS-DSPI). The BSTA is a full size, one-sixth section of the JWST primary mirror backplane assembly (PMBA). The BSTA, measuring almost 3 m across, contains most of the prominent structural elements of the backplane and is to our knowledge the largest structure ever measured with SPS-DSPI at cryogenic conditions. The SPS-DSPI measured rigid body motion and deformations of BSTA to nanometer-level accuracy. The SPS-DSPI was developed specifically for the purposes of this test and other tests of large cryogenic structures for JWST.

Calibration of spatially phase-shifted DSPI for measurement of large structures.

We present a method for the calibration of a spatially phase-shifted digital speckle pattern interferometer (SPS-DSPI), which was designed and built for the purpose of testing the James Webb space telescope (JWST) optical structures and related technology development structures. The need to measure dynamic deformations of large, diffuse structures to nanometer accuracy at cryogenic temperature is paramount in the characterization of a large diameter space and terrestrial based telescopes. The techniques described herein apply to any situation, in which high accuracy measurement of diffuse structures are required. The calibration of the instrument is done using a single-crystal silicon gauge. The gauge has four islands of different heights that change in a predictable manner as a function of temperature. The SPS-DSPI is used to measure the relative piston between the islands as the temperature of the gauge is changed. The measurement results are then compared with the theoretical changes in the height of the gauge islands. The maximum deviation of the measured rate of change of the relative piston in nm/K from the expected value is 3.3%.

Sub-quarter-wave multilayer coatings with high reflectance in the extreme ultraviolet.

Multilayer coatings with a small number of layers were designed and prepared to provide an increase in normal-incidence reflectance in the extreme ultraviolet compared with the reflectance of available single-layer coatings, namely, SiC, B4C, and Ir. Multilayers were designed to produce coatings with the highest possible reflectance at 91.2 and at 58.4 nm. At these wavelengths all the materials absorb radiation strongly, but still a reflectance enhancement can be obtained by means of sub-quarter-wave multilayer coatings with two or more different materials. Sub-quarter-wave multilayer coatings based on Al, MgF2, diamondlike carbon, B4C, SiC, and Ir showed higher reflectance than single-layer coatings of SiC and B4C not only at the target wavelength but in a wide band ranging from 50 nm to the 121.6-nm H Lyman-alpha line. Multilayer coatings suffered some reflectance degradation over time. However, after approximately 80-100 days of aging in a desiccator, the reflectance for the multilayer coatings was greater than for the single-layer coatings.