Analysis of detection enhancement using microcantilevers with long-slit-based sensors.

The present work analyzes theoretically and verifies the advantage of utilizing rectangular microcantilevers with long-slits in microsensing applications. The deflection profile of these microcantilevers is compared with that of typical rectangular microcantilevers under the action of dynamic disturbances. Various force-loading conditions are considered. The theory of linear elasticity for thin beams is used to obtain the deflection-related quantities. The disturbance in these quantities is obtained based on wave propagation and beam vibration theories. It is found that detections of rectangular microcantilevers with long-slits based on maximum slit opening length can be more than 100 times the deflections of typical rectangular microcantilevers. Moreover, the disturbance (noise effect) in the detection quantities of the microcantilever with long-slits is found to be always smaller than that of typical microcantilevers, regardless of the wavelength, force amplitude, and the frequency of the dynamic disturbance. Eventually, the detection quantities of the microcantilever with long-slits are found to be almost unaffected by dynamic disturbances, as long as the wavelengths of these disturbances are larger than 3.5 times the microcantilever width. Finally, the present work recommends implementation of microcantilevers with long-slits as microsensors in robust applications, including real analyte environments and out of laboratory testing.

Analysis of deflection enhancement using epsilon assembly microcantilevers based sensors.

The present work analyzes theoretically and verifies the advantage of utilizing ɛ-microcantilever assemblies in microsensing applications. The deflection profile of these innovative ɛ-assembly microcantilevers is compared with that of the rectangular microcantilever and modified triangular microcantlever. Various force-loading conditions are considered. The theorem of linear elasticity for thin beams is used to obtain the deflections. The obtained defections are validated against an accurate numerical solution utilizing finite element method with maximum deviation less than 10 percent. It is found that the ɛ-assembly produces larger deflections than the rectangular microcantilever under the same base surface stress and same extension length. In addition, the ɛ-microcantilever assembly is found to produce larger deflection than the modified triangular microcantilever. This deflection enhancement is found to increase as the ɛ-assembly's free length decreases for various types of force loading conditions. Consequently, the ɛ-microcantilever is shown to be superior in microsensing applications as it provides favorable high detection capability with a reduced susceptibility to external noises. Finally, this work paves a way for experimentally testing the ɛ-assembly to show whether detective potential of microsensors can be increased.