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1.
Nano Futures ; 1(1): 015005, 2017 Jun.
Artigo em Inglês | MEDLINE | ID: mdl-28890941

RESUMO

We present measurements of focal spot size and brightness in a focused ion beam system utilizing a laser-cooled atomic beam source of Cs ions. Spot sizes as small as (2.1 ± 0.2) nm (one standard deviation) and reduced brightness values as high as (2.4 ± 0.1) × 107 A m-2 Sr-1 eV-1 are observed with a 10 keV beam. This measured brightness is over 24 times higher than the highest brightness observed in a Ga liquid metal ion source. The behavior of brightness as a function of beam current and the dependence of effective source temperature on ionization energy are examined. The performance is seen to be consistent with earlier predictions. Demonstration of this source with very high brightness, producing a heavy ionic species such as Cs+, promises to allow significant improvements in resolution and throughput for such applications as next-generation circuit edit and nanoscale secondary ion mass spectrometry.

2.
Appl Phys Rev ; 3(1)2016 Mar.
Artigo em Inglês | MEDLINE | ID: mdl-27239245

RESUMO

Nanoscale focused ion beams (FIBs) represent one of the most useful tools in nanotechnology, enabling nanofabrication via milling and gas-assisted deposition, microscopy and microanalysis, and selective, spatially resolved doping of materials. Recently, a new type of FIB source has emerged, which uses ionization of laser cooled neutral atoms to produce the ion beam. The extremely cold temperatures attainable with laser cooling (in the range of 100 µK or below) result in a beam of ions with a very small transverse velocity distribution. This corresponds to a source with extremely high brightness that rivals or may even exceed the brightness of the industry standard Ga+ liquid metal ion source. In this review we discuss the context of ion beam technology in which these new ion sources can play a role, their principles of operation, and some examples of recent demonstrations. The field is relatively new, so only a few applications have been demonstrated, most notably low energy ion microscopy with Li ions. Nevertheless, a number of promising new approaches have been proposed and/or demonstrated, suggesting that a rapid evolution of this type of source is likely in the near future.

3.
Phys Rev Lett ; 104(17): 173001, 2010 Apr 30.
Artigo em Inglês | MEDLINE | ID: mdl-20482104

RESUMO

We demonstrate the state dependence of the ponderomotive energy shift of Rydberg atoms in an optical lattice using microwave spectroscopy. Unique to Rydberg atoms, this dependence results from a state-dependent aspect ratio between Rydberg-atom size and lattice period. A semiclassical simulation reproduces all features observed in the microwave spectra and indicates the presence of trapped Rydberg atoms.

4.
Phys Rev Lett ; 100(23): 233201, 2008 Jun 13.
Artigo em Inglês | MEDLINE | ID: mdl-18643495

RESUMO

The energy level spectrum of a many-body system containing two shared, collective Rydberg excitations is measured using cold atoms in an optical dipole trap. Two pairs of independently tunable laser pulses are employed to spectroscopically probe the spectrum in a double-resonance excitation scheme. Depending on the magnitude of an applied electric field, the Rydberg-atom interactions can vary from resonant dipole-dipole to attractive or repulsive van der Waals, leading to characteristic signatures in the measured spectra. Our results agree with theoretical estimates of the magnitude and sign of the interactions.

5.
Phys Rev Lett ; 100(17): 175002, 2008 May 02.
Artigo em Inglês | MEDLINE | ID: mdl-18518302

RESUMO

We demonstrate the trapping of a strongly magnetized, quasineutral ultracold plasma in a nested Penning trap with a background field of 2.9 T. Electrons remain trapped in this system for several milliseconds. Early in the evolution, the dynamics are driven by a breathing-mode oscillation in the ionic charge distribution, which modulates the electron trap depth. Over longer times scales, the electronic component undergoes cooling. Trap loss resulting from E x B drift is characterized.

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