1.
Ultramicroscopy
; 85(2): 93-8, 2000 Oct.
Artigo
em Inglês
| MEDLINE
| ID: mdl-11014482
RESUMO
We present here an efficient method to prepare a transmission electron microscopy (TEM) specimen for selective observation of the cross-section of individual nanoscale structures. As a typical example, the cross-sectional TEM observation of a quasi-one-dimensional material - a nano-electronic component based on an individual carbon nanotube - is presented.
2.