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2.
Ultramicroscopy ; 151: 23-30, 2015 Apr.
Artigo em Inglês | MEDLINE | ID: mdl-25522869

RESUMO

We consider theoretically the energy loss of electrons scattered to high angles when assuming that the primary beam can be limited to a single atom. We discuss the possibility of identifying the isotopes of light elements and of extracting information about phonons in this signal. The energy loss is related to the mass of the much heavier nucleus, and is spread out due to atomic vibrations. Importantly, while the width of the broadening is much larger than the energy separation of isotopes, only the shift in the peak positions must be detected if the beam is limited to a single atom. We conclude that the experimental case will be challenging but is not excluded by the physical principles as far as considered here. Moreover, the initial experiments demonstrate that the separation of gold and carbon based on a signal that is related to their mass, rather than their atomic number.

3.
Ultramicroscopy ; 145: 13-21, 2014 Oct.
Artigo em Inglês | MEDLINE | ID: mdl-24315660

RESUMO

Beam-induced structural modifications are a major nuisance in the study of materials by high-resolution electron microscopy. Here, we introduce a new approach to circumvent the radiation damage problem by a statistical treatment of large, noisy, low-dose data sets of non-periodic configurations (e.g. defects) in the material. We distribute the dose over a mixture of different defect structures at random positions and with random orientations, and recover representative model images via a maximum likelihood search. We demonstrate reconstructions from simulated images at such low doses that the location of individual entities is not possible. The approach may open a route to study currently inaccessible beam-sensitive configurations.


Assuntos
Microscopia Eletrônica/métodos , Elétrons/efeitos adversos , Grafite/química , Grafite/efeitos da radiação , Guanina/química , Guanina/efeitos da radiação , Processamento de Imagem Assistida por Computador/estatística & dados numéricos , Funções Verossimilhança , Conceitos Matemáticos , Microscopia Eletrônica/estatística & dados numéricos , Microscopia Eletrônica de Transmissão e Varredura/estatística & dados numéricos , Microscopia Eletrônica de Transmissão/estatística & dados numéricos , Estrutura Molecular
4.
Phys Rev Lett ; 106(10): 105505, 2011 Mar 11.
Artigo em Inglês | MEDLINE | ID: mdl-21469806

RESUMO

While crystalline two-dimensional materials have become an experimental reality during the past few years, an amorphous 2D material has not been reported before. Here, using electron irradiation we create an sp2-hybridized one-atom-thick flat carbon membrane with a random arrangement of polygons, including four-membered carbon rings. We show how the transformation occurs step by step by nucleation and growth of low-energy multivacancy structures constructed of rotated hexagons and other polygons. Our observations, along with first-principles calculations, provide new insights to the bonding behavior of carbon and dynamics of defects in graphene. The created domains possess a band gap, which may open new possibilities for engineering graphene-based electronic devices.

5.
Nanotechnology ; 22(17): 175306, 2011 Apr 29.
Artigo em Inglês | MEDLINE | ID: mdl-21411912

RESUMO

Using atomistic computer simulations, we study how ion irradiation can be used to alter the morphology of a graphene monolayer, by introducing defects of specific type, and to cut graphene sheets. Based on the results of our analytical potential molecular dynamics simulations, a kinetic Monte Carlo code is developed for modeling morphological changes in a graphene monolayer under irradiation at macroscopic time scales. Impacts of He, Ne, Ar, Kr, Xe, and Ga ions with kinetic energies ranging from tens of eV to 10 MeV and angles of incidence between 0° and 88° are studied. Our results provide microscopic insights into the response of graphene to ion irradiation and can directly be used for the optimization of graphene cutting and patterning with focused ion beams.

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