1.
Opt Lett
; 20(10): 1110-2, 1995 May 15.
Artigo
em Inglês
| MEDLINE
| ID: mdl-19859441
RESUMO
We extend the z-scan technique to provide for measurements of the sign and the magnitude of all the independent components of chi((3)) for isotropic and cubic-symmetry materials. This technique is used to measure the dispersion of the tensor components of the real and the imaginary parts of chi((3)) for various wide-gap semiconductor materials by use of femtosecond laser pulses. Our measurements of the polarization dichroism of the nonlinear-index and two-photon absorption coefficients are in fair agreement with recent theoretical calculations; however, substantial discrepancies exist between the measured and predicted values for the corresponding anisotropy parameters.