RESUMO
We calculate the coherent and incoherent scattering of p- and s-polarized light incident from a dielectric medium characterized by a real, positive, dielectric constant epsilon0 onto its one-dimensional, randomly rough interface with a dielectric medium characterized by a real, positive, dielectric constant epsilon. We use a perturbation theory with a new small parameter, namely, the dielectric contrast eta = epsilon0 - epsilon between the medium of incidence and the scattering medium. The proper self-energy entering the expression for the reflectivity is obtained as an expansion in powers of eta through the second order in eta, and the reducible vertex function in terms of which the scattered intensity is expressed is obtained as an expansion in powers of eta through the fourth. The roughness-induced shifts of the Brewster angle (in p polarization) and of the critical angle for total internal reflection (epsilon0 > epsilon) are obtained. The angular dependence of the intensity of the incoherent component of the scattered light displays an enhanced backscattering peak, which is due to the coherent interference of multiply scattered lateral waves supported by the interface and their reciprocal partners. Analogs of the Yoneda peaks observed in the scattering of x rays from solid surfaces are also present. The results obtained by our small-contrast perturbation theory are in good agreement with those obtained in computer simulation studies.
