1.
Phys Chem Chem Phys
; 8(24): 2819-22, 2006 Jun 28.
Artigo
em Inglês
| MEDLINE
| ID: mdl-16775635
RESUMO
We have invented a new device based on atomic force microscopy that measures the emission from a single microparticle by force direct application using the AFM probe, and successfully observed emission in the region of the elastic deformation, friction, and destructive deformation.