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1.
Phys Rev Lett ; 129(24): 244802, 2022 Dec 09.
Artigo em Inglês | MEDLINE | ID: mdl-36563244

RESUMO

Creating, manipulating, and detecting coherent electrons is at the heart of future quantum microscopy and spectroscopy technologies. Leveraging and specifically altering the quantum features of an electron beam source at low temperatures can enhance its emission properties. Here, we describe electron field emission from a monocrystalline, superconducting niobium nanotip at a temperature of 5.9 K. The emitted electron energy spectrum reveals an ultranarrow distribution down to 16 meV due to tunable resonant tunneling field emission via localized band states at a nanoprotrusion's apex and a cutoff at the sharp low-temperature Fermi edge. This is an order of magnitude lower than for conventional field emission electron sources. The self-focusing geometry of the tip leads to emission in an angle of 3.7°, a reduced brightness of 3.8×10^{8} A/(m^{2} sr V), and a stability of hours at 4.1 nA beam current and 69 meV energy width. This source will decrease the impact of lens aberration and enable new modes in low-energy electron microscopy, electron energy loss spectroscopy, and high-resolution vibrational spectroscopy.

2.
Ultramicroscopy ; 183: 77-83, 2017 12.
Artigo em Inglês | MEDLINE | ID: mdl-28506559

RESUMO

An electron mirror-based pulse compressor design has been developed for improving the temporal resolution of dynamic/ultrafast transmission electron microscopes and ultrafast electron diffraction cameras. The improvement will enable electron microscopes and diffraction cameras to better resolve the dynamics of reactions in the areas of solid state physics, chemistry, and biology. The design utilizes a combination of mirror optics and a magnetic beam separator, which exploits the symmetry inherent in reversing the electron trajectory in the mirror in order to compress the pulse. This system can also simultaneously correct the spherical and chromatic aberration of the objective lens for improved spatial resolution. For pulsed experiments with a practical bunch charge, the correction of the chromatic aberration coefficient counters the spread in the electron energies induced by the space charge of the pulse to make possible the probing of the sample with high spatial resolution. The pulse compressor can accommodate pulses with a range of electron densities and energy spreads. Furthermore, it is designed to fit into both ultrafast electron diffraction cameras and dynamic/ultrafast transmission electron microscopes. Consequently, this instrument is suitable for enhancing the study of the structure, composition, and bonding states of new materials at ultrafast time scales.

3.
Ultramicroscopy ; 145: 36-49, 2014 Oct.
Artigo em Inglês | MEDLINE | ID: mdl-24524867

RESUMO

Monochromatic, aberration-corrected, dual-beam low energy electron microscopy (MAD-LEEM) is a novel technique that is directed towards imaging nanostructures and surfaces with sub-nanometer resolution. The technique combines a monochromator, a mirror aberration corrector, an energy filter, and dual beam illumination in a single instrument. The monochromator reduces the energy spread of the illuminating electron beam, which significantly improves spectroscopic and spatial resolution. Simulation results predict that the novel aberration corrector design will eliminate the second rank chromatic and third and fifth order spherical aberrations, thereby improving the resolution into the sub-nanometer regime at landing energies as low as one hundred electron-Volts. The energy filter produces a beam that can extract detailed information about the chemical composition and local electronic states of non-periodic objects such as nanoparticles, interfaces, defects, and macromolecules. The dual flood illumination eliminates charging effects that are generated when a conventional LEEM is used to image insulating specimens. A potential application for MAD-LEEM is in DNA sequencing, which requires high resolution to distinguish the individual bases and high speed to reduce the cost. The MAD-LEEM approach images the DNA with low electron impact energies, which provides nucleobase contrast mechanisms without organometallic labels. Furthermore, the micron-size field of view when combined with imaging on the fly provides long read lengths, thereby reducing the demand on assembling the sequence. Experimental results from bulk specimens with immobilized single-base oligonucleotides demonstrate that base specific contrast is available with reflected, photo-emitted, and Auger electrons. Image contrast simulations of model rectangular features mimicking the individual nucleotides in a DNA strand have been developed to translate measurements of contrast on bulk DNA to the detectability of individual DNA bases in a sequence.


Assuntos
Microscopia Eletrônica/instrumentação , Análise de Sequência de DNA/instrumentação , Simulação por Computador , DNA de Forma B/química , DNA de Forma B/ultraestrutura , Elétrons , Desenho de Equipamento , Sequenciamento de Nucleotídeos em Larga Escala/instrumentação , Sequenciamento de Nucleotídeos em Larga Escala/métodos , Sequenciamento de Nucleotídeos em Larga Escala/estatística & dados numéricos , Microscopia Eletrônica/métodos , Microscopia Eletrônica/estatística & dados numéricos , Nanoestruturas , Dispositivos Ópticos , Fenômenos Ópticos , Espectroscopia Fotoeletrônica , Análise de Sequência de DNA/métodos , Análise de Sequência de DNA/estatística & dados numéricos , Propriedades de Superfície
4.
Ultramicroscopy ; 93(3-4): 347-54, 2002 Dec.
Artigo em Inglês | MEDLINE | ID: mdl-12492244

RESUMO

The impact of electron-electron interactions on the electron-optical performance of imaging cathode objective lenses is evaluated. Three types of cathode objectives are considered: decelerating and accelerating electrostatic, and combined magnetic lenses. The beam blur is calculated for field sizes ranging from 50 microm x 50 microm to 500 microm x 500 microm and total beam currents ranging from 200 nA to 20 microA. The functional dependence of the beam blur upon electron beam current and current density is elucidated in detail.

6.
Phys Rev Lett ; 76(17): 3200-3203, 1996 Apr 22.
Artigo em Inglês | MEDLINE | ID: mdl-10060900
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