Photoluminescence Quenching and Enhanced Optical Conductivity of P3HT-Derived Ho(3+)-Doped ZnO Nanostructures.

In this article, we demonstrate the surface effect and optoelectronic properties of holmium (Ho(3+))-doped ZnO in P3HT polymer nanocomposite. We incorporated ZnO:Ho(3+) (0.5 mol% Ho) nanostructures in the pristine P3HT-conjugated polymer and systematically studied the effect of the nanostructures on the optical characteristics. Detailed UV-Vis spectroscopy analysis revealed enhanced absorption coefficient and optical conductivity in the P3HT-ZnO:Ho(3+) film as compared to the pristine P3HT. Moreover, the obtained photoluminescence (PL) results established the improvement of exciton dissociation as a result of ZnO:Ho(3+) nanostructures inclusion. The occurrence of PL quenching is the result of enhanced charge transfer due to ZnO:Ho(3+) nanostructures in the polymer, whereas energy transfer from ZnO:Ho(3+) to P3HT was verified. Overall, the current investigation revealed a systematic tailoring of the optoelectronic properties of pristine P3HT after inclusion of ZnO:Ho(3+) nanostructures, thus opening brilliant perspectives for applications in various optoelectronic devices.

Effects of thermal treatment and depth profiling analysis of solution processed bulk-heterojunction organic photovoltaic cells.

We report the use of solution processed zinc oxide (ZnO) nanoparticles as a buffer layer inserted between the top metal electrode and the photo-active layer in bulk-heterojunction (BHJ) organic solar cell (OSC) devices. The photovoltaic properties were compared for devices annealed before (Device A) or after (Device B) the deposition of the Al top electrode. The post-annealing treatment was shown to improve the power conversion efficiency up to 2.93% and the fill factor (FF) up to 63% under AM1.5 (100mW/cm(2)) illumination. We performed the depth profile/interface analysis and elemental mapping using the time-of-flight secondary ion mass spectrometry (TOF-SIMS). Signals arising from (27)Al, (16)O, (12)C, (32)S, (64)Zn, (28)Si, (120)Sn and (115)In give an indication of successive deposition of Al, ZnO, P3HT:PCBM and PEDOT:PSS layers on ITO coated glass substrates. Furthermore, we discuss the surface imaging and visualize the chemical information on the surface of the devices.