A chip-scale atomic beam clock.

Atomic beams are a longstanding technology for atom-based sensors and clocks with widespread use in commercial frequency standards. Here, we report the demonstration of a chip-scale microwave atomic beam clock using coherent population trapping (CPT) interrogation in a passively pumped atomic beam device. The beam device consists of a hermetically sealed vacuum cell fabricated from an anodically bonded stack of glass and Si wafers in which lithographically defined capillaries produce Rb atomic beams and passive pumps maintain the vacuum environment. A prototype chip-scale clock is realized using Ramsey CPT spectroscopy of the atomic beam over a 10 mm distance and demonstrates a fractional frequency stability of ≈1.2 × 10-9/[Formula: see text] for integration times, τ, from 1 s to 250 s, limited by detection noise. Optimized atomic beam clocks based on this approach may exceed the long-term stability of existing chip-scale clocks, and leading long-term systematics are predicted to limit the ultimate fractional frequency stability below 10-12.

Direct-Write Lithiation of Silicon Using a Focused Ion Beam of Li.

Electrochemical processes that govern the performance of lithium ion batteries involve numerous parallel reactions and interfacial phenomena that complicate the microscopic understanding of these systems. To study the behavior of ion transport and reaction in these applications, we report the use of a focused ion beam of Li+ to locally insert controlled quantities of lithium with high spatial resolution into electrochemically relevant materials in vacuo. To benchmark the technique, we present results on direct-write lithiation of 35 nm thick crystalline silicon membranes using a 2 keV beam of Li+ at doses up to 1018 cm-2 (104 nm-2). We confirm quantitative sub-µm control of lithium insertion and characterize the concomitant morphological, structural, and functional changes of the system using a combination of electron and scanning probe microscopy. We observe saturation of interstitial lithium in the silicon membrane at ≈10% dopant number density and spillover of excess lithium onto the membrane's surface. The implanted Li+ is demonstrated to remain electrochemically active. This technique will enable controlled studies and improve understanding of Li+ ion interaction with local defect structures and interfaces in electrode and solid-electrolyte materials.

Two-Year Longitudinal Changes in Lower Limb Strength and Its Relation to Loss in Function in a Large Cohort of Patients With Duchenne Muscular Dystrophy.

OBJECTIVE: The main objective of this study was to examine the effect of disease on strength in two functionally important lower limb muscles for a period of 2 yrs in children with Duchene muscular dystrophy. DESIGN: Seventy-seven Duchene muscular dystrophy children participated in this study. Plantar flexors, knee extensors, strength, and performance on timed tests (6-min walk, 4-stairs, 10-m walk, supine-up) were assessed yearly for 2 yrs. Multivariate normal regression was used to assess changes in strength over time in the Duchene muscular dystrophy group. Spearman correlations were computed to examine relationship between strength and function. RESULTS: Normalized plantar flexor and knee extensor strength showed a significant decrease (P < 0.05) over 2 yrs, with larger declines in knee extensor. At baseline, knee extensor strongly correlated with performance on timed tests. However, plantar flexor strength was found to be a stronger predictor of loss in ambulatory function. Modest correlations (r = 0.19-0.34) were found between the decline in strength and functional performance over 2 yrs. CONCLUSIONS: This study describes the loss of lower limb strength in a large cohort of Duchene muscular dystrophy children for 2 yrs. The findings support that lower limb strength alone cannot account for the decline in performance on functional tests, and the role of other contributing factors, such as compensatory strategies, should be considered.

Two-dimensional imaging and modification of nanophotonic resonator modes using a focused ion beam.

High-resolution imaging of optical resonator modes is a key step in the development and characterization of nanophotonic devices. Many sub-wavelength mode-imaging techniques have been developed using optical and electron beam excitation-each with its own limitations in spectral and spatial resolution. Here, we report a 2D imaging technique using a pulsed, low-energy focused ion beam of Li+ to probe the near-surface fields inside photonic resonators. The ion beam locally modifies the resonator structure, causing temporally varying spectroscopic shifts of the resonator. We demonstrate this imaging technique on several optical modes of silicon microdisk resonators by rastering the ion beam across the disk surface and extracting the maximum mode shift at the location of each ion pulse. A small shift caused by ion beam heating is also observed and is independently extracted to directly measure the thermal response of the device. This technique enables visualization of the splitting of degenerate modes into spatially-resolved standing waves and permits persistent optical mode editing. Ion beam probing enables minimally perturbative, in operando imaging of nanophotonic devices with high resolution and speed.

Comparison of Nanoscale Focused Ion Beam and Electrochemical Lithiation in ß-Sn Microspheres.

The development of Li focused ion beams (Li-FIB) enables controlled Li ion insertion into materials with nanoscale resolution. We take the first step toward establishing the relevance of the Li-FIB for studies of ion dynamics in electrochemically active materials by comparing FIB lithiation with conventional electrochemical lithiation of isolated ß-Sn microspheres. Samples are characterized by cross-sectioning with Ga FIB and imaging via electron microscopy. The Li-FIB and electrochemical lithiated Sn exhibit similarities that suggest that the Li-FIB can be a powerful tool for exploring dynamical Li ion-material interactions at the nanoscale in a range of battery materials.

Capacitación: adiestramiento y formación profesional / Staff training, development and education

La finalidad de esta obra es facilitar el desarrollo del personal, mediante el empleo adecuado de las técnicas de selección, evaluación y capacitación y asimismo servir de guía a los directivos responsables de la formación de éste en su difícil tarea de desarrollar al máximo la potencialidad de los recursos humanos de la empresa. En este libro se estudia la función del adiestramiento como instrumento de la dirección, los métodos de la contabilidad de costos, la ingeniería y demás aspectos inherentes a una adecuada administración de personal