Remote sensing of crop parameters with a polarized, frequency-doubled Nd:YAG laser.

Polarized laser remote-sensing measurements that correlate the yield, the normalized difference vegetation index, and the leaf area index with the depolarized backscattered radiation from corn plots grown with eight different nitrogen fertilization dosages are presented. A polarized Nd:YAG laser emitting at 1064 and 532 nm is used. Depolarization increased significantly with increasing fertilization at the infrared wavelength, and there was a decrease in the depolarization at the green wavelength. The depolarization spectral difference index, defined as the absolute difference in the depolarization at the two wavelengths, is introduced as a parameter that is an indicator of the condition of the internal leaf structure.