Defect identification and statistics toolbox: automated defect analysis for scanning probe microscopy images.

Identifying and classifying defects in scanning probe microscopy (SPM) images is an important task that is tedious to perform by hand. In this paper we present the defect identification and statistics toolbox (DIST), an image processing toolbox for identifying and analyzing atomic defects in SPM images. DIST combines automation with user input to accurately and efficiently identify defects and automatically compute critical statistics. We describe using DIST for interactive image processing, generating contour plots for isolating extrema from an image background, and processes for identifying defects.

Very stable electron field emission from strontium titanate coated carbon nanotube matrices with low emission thresholds.

Novel PMMA-STO-CNT matrices were created by opened-tip vertically aligned multiwalled carbon nanotubes (VA-MWCNTs) with conformal coatings of strontium titanate (STO) and poly(methyl methacrylate) (PMMA). Emission threshold of 0.8 V/µm was demonstrated, about 5-fold lower than that of the as-grown VA-MWCNTs. This was obtained after considering the related band structures under the perspective of work functions and tunneling width as a function of the STO thickness. We showed that there is an optimum thickness of STO coatings to effectively reduce the work function of CNTs and yet minimize the tunneling width for electron emissions. Furthermore, simulation and modeling suggest that PMMA-STO-CNT matrices have suppressed screening effects and Coulombs' repulsion forces between electrons in adjacent CNTs, leading to low emission threshold, high emission density, and prolonged emission stability. These findings are important for practical application of VA-MWCNTs in field emission devices, X-ray generation, and wave amplification.

Low-temperature synthesis of indium tin oxide nanowires as the transparent electrodes for organic light emitting devices.

Low-temperature growth of indium tin oxide (ITO) nanowires (NWs) was obtained on catalyst-free amorphous glass substrates at 250 °C by Nd:YAG pulsed-laser deposition. These ITO NWs have branching morphology as grown in Ar ambient. As suggested by scanning electron microscopy (SEM) and high-resolution transmission electron microscopy (HRTEM), our ITO NWs have the tendency to grow vertically outward from the substrate surface, with the (400) plane parallel to the longitudinal axis of the nanowires. These NWs are low in electrical resistivity (1.6×10⁻4 Ω cm) and high in visible transmittance (~90­96%), and were tested as the electrode for organic light emitting devices (OLEDs). An enhanced current density of ~30 mA cm⁻² was detected at bias voltages of ~19­21 V with uniform and bright emission. We found that the Hall mobility of these NWs is 2.2­2.7 times higher than that of ITO film, which can be explained by the reduction of Coulomb scattering loss. These results suggested that ITO nanowires are promising for applications in optoelectronic devices including OLED, touch screen displays, and photovoltaic solar cells.

Stable electron field emission from PMMA-CNT matrices.

We have created PMMA-CNT matrices by embedding opened-tip vertically aligned multiwalled carbon nanotubes (VA-MWCNTs) with poly(methyl methacrylate) (PMMA). These PMMA-CNT matrices are excellent electron field emitters with an emission threshold field of 1.675 V/µm, more than 2-fold lower that that of the as-grown sample. In addition, the emission site density from these matrices is high, merely filling up the entire sample surface. Emission stability test at ∼1.35 mA/cm(2) was performed continuously for 40 h with no significant degradation. On the basis of our theoretical simulation and hypothetical modeling, we attribute these performances to the reduced screening effect and fewer Joule heatings due to the shorter effective transport distance of the electrons in MWCNTs.