RESUMO
Layered crystals are known to be good candidates for bulk thermoelectric applications as they open new ways to realise highly efficient devices. Two dimensional materials, isolated from layered materials, and their stacking into heterostructures have attracted intense research attention for nanoscale applications due to their high Seebeck coefficient and possibilities to engineer their thermoelectric properties. However, integration to thermoelectric devices is problematic due to their usually high thermal conductivities. Reporting on thermal transport studies between 150 and 300 K, we show that franckeite, a naturally occurring 2D heterostructure, exhibits a very low thermal conductivity which combined with its previously reported high Seebeck coefficient and electrical conductance make it a promising candidate for low dimensional thermoelectric applications. We find cross- and in-plane thermal conductivity values at room temperature of 0.70 and 0.88 W m-1 K-1, respectively, which is one of the lowest values reported today for 2D-materials. Interestingly, a 1.77 nm thick layer of franckeite shows very low thermal conductivity similar to one of the most widely used thermoelectric material Bi2Te3 with the thickness of 10-20 nm. We show that this is due to the low Debye frequency of franckeite and scattering of phonon transport through van der Waals interface between different layers. This observation open new routes for high efficient ultra-thin thermoelectric applications.
RESUMO
Graphene's (GR) remarkable mechanical and electrical properties-such as its Young's modulus, low mass per unit area, natural atomic flatness and electrical conductance-would make it an ideal material for micro and nanoelectromechanical systems (MEMS and NEMS). However, the difficulty of attaching GR to supports, coupled with naturally occurring internal defects in a few layer GR can significantly adversely affect the performance of such devices. Here, we have used a combined contact resonance atomic force microscopy (CR-AFM) and ultrasonic force microscopy (UFM) approach to characterise and map with nanoscale spatial resolution GR membrane properties inaccessible to most conventional scanning probe characterisation techniques. Using a multi-layer GR plate (membrane) suspended over a round hole, we show that this combined approach allows access to the mechanical properties, internal structure and attachment geometry of the membrane providing information about both the supported and suspended regions of the system. We show that UFM allows the precise geometrical position of the supported membrane-substrate contact to be located and provides an indication of the local variation of its quality in the contact areas. At the same time, we show that by mapping the position sensitive frequency and phase response of CR-AFM response, one can reliably quantify the membrane stiffness, and image the defects in the suspended area of the membrane. The phase and amplitude of experimental CR-AFM measurements show excellent agreement with an analytical model accounting for the resonance of the combined CR-AFM probe-membrane system. The combination of UFM and CR-AFM provide a beneficial combination for the investigation of few-layer NEMS systems based on two dimensional materials.
