Dislocations Accelerate Oxygen Ion Diffusion in La0.8Sr0.2MnO3 Epitaxial Thin Films.

Revealing whether dislocations accelerate oxygen ion transport is important for providing abilities in tuning the ionic conductivity of ceramic materials. In this study, we report how dislocations affect oxygen ion diffusion in Sr-doped LaMnO3 (LSM), a model perovskite oxide that serves in energy conversion technologies. LSM epitaxial thin films with thicknesses ranging from 10 nm to more than 100 nm were prepared by pulsed laser deposition on single-crystal LaAlO3 and SrTiO3 substrates. The lattice mismatch between the film and substrates induces compressive or tensile in-plane strain in the LSM layers. This lattice strain is partially reduced by dislocations, especially in the LSM films on LaAlO3. Oxygen isotope exchange measured by secondary ion mass spectrometry revealed the existence of at least two very different diffusion coefficients in the LSM films on LaAlO3. The diffusion profiles can be quantitatively explained by the existence of fast oxygen ion diffusion along threading dislocations that is faster by up to 3 orders of magnitude compared to that in LSM bulk.

Consequences of the CMR effect on EELS in TEM.

Double perovskite oxides have gained in importance and exhibit negative magnetoresistance, which is known as colossal magnetoresistance (CMR) effect. Using a La2CoMnO6 (LCM) thin film layer, we proved that the physical consequences of the CMR effect do also influence the electron energy loss spectrometry (EELS) signal. We observed a change of the band gap at low energy losses and were able to study the magnetisation with chemical sensitivity by employing energy loss magnetic chiral dichroism (EMCD) below the Curie temperature TC, where the CMR effect becomes significant.

The Chemical Capacitance as a Fingerprint of Defect Chemistry in Mixed Conducting Oxides.

The oxygen stoichiometry of mixed conducting oxides depends on the oxygen chemical potential and thus on the oxygen partial pressure in the gas phase. Also voltages may change the local oxygen stoichiometry and the amount to which such changes take place is quantified by the chemical capacitance of the sample. Impedance spectroscopy can be used to probe this chemical capacitance. Impedance measurements on different oxides ((La,Sr)FeO3-δ = LSF, Sr(Ti,Fe)O3-δ = STF, and Pb(Zr,Ti)O3 = PZT) are presented, and demonstrate how the chemical capacitance may affect impedance spectra in different types of electrochemical cells. A quantitative analysis of the spectra is based on generalized equivalent circuits developed for mixed conducting oxides by J. Jamnik and J. Maier. It is discussed how defect chemical information can be deduced from the chemical capacitance.

Water-Induced Decoupling of Tracer and Electrochemical Oxygen Exchange Kinetics on Mixed Conducting Electrodes.

Isotope exchange depth profiling and electrochemical impedance spectroscopy are usually regarded as complementary tools for measuring the surface oxygen exchange activity of mixed conducting oxides, for example used in solid oxide fuel cell (SOFC) electrodes. Only very few studies compared electrical (k(q)) and tracer (k*) exchange coefficients of solid-gas interfaces measured under identical conditions. The 1:1 correlation between k(q) and k* often made is thus more an assumption than experimentally verified. In this study it is shown that the measured rates of electrical and tracer exchange of oxygen may strongly differ. Simultaneous acquisition of k(q) and k* on La0.6Sr0.4FeO3-δ and SrTi0.3Fe0.7O3-δ thin film electrodes revealed that k* > 100 k(q) in humid oxidizing ((16)O2 + H2(18)O) and humid reducing (H2 + H2(18)O) atmospheres. These results are explained by fast water adsorption and dissociation on surface oxygen vacancies, forming two surface hydroxyl groups. Hence, interpreting experimentally determined k* values in terms of electrochemically relevant oxygen exchange is not straightforward.

Operando X-ray Investigation of Electrode/Electrolyte Interfaces in Model Solid Oxide Fuel Cells.

We employed operando anomalous surface X-ray diffraction to investigate the buried interface between the cathode and the electrolyte of a model solid oxide fuel cell with atomic resolution. The cell was studied under different oxygen pressures at elevated temperatures and polarizations by external potential control. Making use of anomalous X-ray diffraction effects at the Y and Zr K-edges allowed us to resolve the interfacial structure and chemical composition of a (100)-oriented, 9.5 mol % yttria-stabilized zirconia (YSZ) single crystal electrolyte below a La0.6Sr0.4CoO3-δ (LSC) electrode. We observe yttrium segregation toward the YSZ/LSC electrolyte/electrode interface under reducing conditions. Under oxidizing conditions, the interface becomes Y depleted. The yttrium segregation is corroborated by an enhanced outward relaxation of the YSZ interfacial metal ion layer. At the same time, an increase in point defect concentration in the electrolyte at the interface was observed, as evidenced by reduced YSZ crystallographic site occupancies for the cations as well as the oxygen ions. Such changes in composition are expected to strongly influence the oxygen ion transport through this interface which plays an important role for the performance of solid oxide fuel cells. The structure of the interface is compared to the bare YSZ(100) surface structure near the microelectrode under identical conditions and to the structure of the YSZ(100) surface prepared under ultrahigh vacuum conditions.

The Effect of Acceptor and Donor Doping on Oxygen Vacancy Concentrations in Lead Zirconate Titanate (PZT).

The different properties of acceptor-doped (hard) and donor-doped (soft) lead zirconate titanate (PZT) ceramics are often attributed to different amounts of oxygen vacancies introduced by the dopant. Acceptor doping is believed to cause high oxygen vacancy concentrations, while donors are expected to strongly suppress their amount. In this study, La3+ donor-doped, Fe3+ acceptor-doped and La3+/Fe3+-co-doped PZT samples were investigated by oxygen tracer exchange and electrochemical impedance spectroscopy in order to analyse the effect of doping on oxygen vacancy concentrations. Relative changes in the tracer diffusion coefficients for different doping and quantitative relations between defect concentrations allowed estimates of oxygen vacancy concentrations. Donor doping does not completely suppress the formation of oxygen vacancies; rather, it concentrates them in the grain boundary region. Acceptor doping enhances the amount of oxygen vacancies but estimates suggest that bulk concentrations are still in the ppm range, even for 1% acceptor doping. Trapped holes might thus considerably contribute to the charge balancing of the acceptor dopants. This could also be of relevance in understanding the properties of hard and soft PZT.

Fast oxygen exchange and diffusion kinetics of grain boundaries in Sr-doped LaMnO3 thin films.

In this study, the contribution of grain boundaries to the oxygen reduction and diffusion kinetics of La0.8Sr0.2MnO3 (LSM) thin films is investigated. Polycrystalline LSM thin films with columnar grains of different grain sizes as well as epitaxial thin films were prepared by pulsed laser deposition. (18)O tracer exchange experiments were performed at temperatures from 570 °C to 810 °C and subsequently analyzed by secondary ion mass spectrometry (SIMS). The isotope concentration depth profiles of polycrystalline films clearly indicate contributions from diffusion and surface exchange in grains as well as in grain boundaries. Measured depth profiles were analyzed by finite element modeling and revealed the diffusion coefficients D and oxygen exchange coefficients k of both the grain bulk and grain boundaries. Values obtained for grain boundaries (Dgb and kgb) are almost three orders of magnitude higher than those of the grains (Dg and kg). Hence, grain boundaries may not only facilitate fast oxygen diffusion but also fast oxygen exchange kinetics. Variation of the A-site stoichiometry ((La0.8Sr0.2)0.95MnO3) did not lead to large changes of the kinetic parameters. Properties found for epitaxial layers without grain boundaries (Db and kb) are close to those of the grains in polycrystalline layers.

Apparent Oxygen Uphill Diffusion in La0.8Sr0.2MnO3 Thin Films upon Cathodic Polarization.

The impact of cathodic bias on oxygen transport in La0.8Sr0.2MnO3 (LSM) thin films was investigated. Columnar-grown LSM thin films with different microstructures were deposited by pulsed laser deposition. 18O tracer experiments were performed on thin film microelectrodes with an applied cathodic bias of -300 or -450 mV, and the microelectrodes were subsequently analyzed by time-of-flight secondary ion mass spectrometry. The 18O concentration in the cathodically polarized LSM microelectrodes was strongly increased relative to that in the thermally annealed film (without bias). Most remarkable, however, was the appearance of a pronounced 18O fraction maximum in the center of the films. This strongly depended on the applied bias and on the microstructure of the LSM thin layers. The unusual shape of the 18O depth profiles was caused by a combination of Wagner-Hebb-type stoichiometry polarization of the LSM bulk, fast grain boundary transport and voltage-induced modification of the oxygen incorporation kinetics.

Mapping electrochemically driven gas exchange of mixed conducting SrTi0.7Fe0.3O3 - δ and Ce0.8Gd0.2O1.9 thin films by 18O tracer incorporation under reducing atmosphere.

Thermally and electrochemically driven 18O tracer exchange experiments in H2/H218O atmosphere were performed on SrTi0.7Fe0.3O3 - Î´ and Ce0.8Gd0.2O2 - Î´ thin films on single crystalline YSZ substrates. Noble metal current collectors were deposited on both films and electrochemically polarized during the exchange experiment. The resulting tracer distribution was analyzed by spatially resolved secondary ion mass spectrometry. Increased tracer fraction near the current collectors was found under cathodic polarization and decreased tracer fraction under anodic polarization. High cathodic bias leads to enhanced n-type electronic conductivity, which increases the extent of the electrochemically active zone.