RESUMO
A surface charge compensation electron flood gun has been added to the Lawrence Livermore National Laboratory (LLNL) highly charged ion (HCI) emission microscope. HCI surface interaction results in a significant charge residue being left on the surface of insulators and semiconductors. This residual charge causes undesirable aberrations in the microscope images and a reduction of the time-of-flight (T-O-F) mass resolution when studying the surfaces of insulators and semiconductors. The benefits and problems associated with HCI microscopy and recent results of the electron flood gun-enhanced HCI microscope are discussed.
Assuntos
Íons/química , Microscopia Eletrônica , Propriedades de Superfície , Microscopia Eletrônica/métodos , Semicondutores , Análise Espectral/métodosRESUMO
A laboratory-held summer flounder (Paralichthys dentatus) became moribund and presented gross ulcerative and hemorrhagic lesions, concomitant with a space-occupying lesion in the abdominal cavity and a prolapsed rectum. Edema, hemorrhage, and necrosis of the intestine and edema of the stomach wall were noted upon post-mortem examination. Microscopic examination revealed large numbers of Cryptobia in the submucosa of the gut and in the liver.
