RESUMO
Detecting nanomechanical motion has become an important challenge in science and technology. Recently, electromechanical coupling to focused electron beams has emerged as a promising method adapted to ultralow scale systems. However the fundamental measurement processes associated with such complex interaction remain to be explored. Here we report a highly sensitive detection of the Brownian motion of µm-long semiconductor nanowires (InAs). The measurement imprecision is found to be set by the shot noise of the secondary electrons generated along the electromechanical interaction. By carefully analyzing the nanoelectromechanical dynamics, we demonstrate the existence of a radial backaction process that we identify as originating from the momentum exchange between the electron beam and the nanomechanical device, which is also known as radiation pressure.
RESUMO
Using focused electron-beam-induced deposition, we fabricate a vertical, platinum-coated cobalt nanowire with a controlled three-dimensional structure. The latter is engineered to feature bends along the height: these are used as pinning sites for domain walls, which are obtained at remanence after saturation of the nanostructure in a horizontally applied magnetic field. The presence of domain walls is investigated using x-ray magnetic circular dichroism (XMCD) coupled to photoemission electron microscopy (PEEM). The vertical geometry of our sample combined with the low incidence of the x-ray beam produce an extended wire shadow which we use to recover the wire's magnetic configuration. In this transmission configuration, the whole sample volume is probed, thus circumventing the limitation of PEEM to surfaces. This article reports on the first study of magnetic nanostructures standing perpendicular to the substrate with XMCD-PEEM. The use of this technique in shadow mode enabled us to confirm the presence of a domain wall without direct imaging of the nanowire.
