Mobility enhancement by Sb-mediated minimisation of stacking fault density in InAs nanowires grown on silicon.

We report the growth of InAs(1-x)Sb(x) nanowires (0 ≤ x ≤ 0.15) grown by catalyst-free molecular beam epitaxy on silicon (111) substrates. We observed a sharp decrease of stacking fault density in the InAs(1-x)Sb(x) nanowire crystal structure with increasing antimony content. This decrease leads to a significant increase in the field-effect mobility, this being more than three times greater at room temperature for InAs0.85Sb0.15 nanowires than InAs nanowires.