The interplay between vapour, liquid, and solid phases in laser powder bed fusion.

The capability of producing complex, high performance metal parts on demand has established laser powder bed fusion (LPBF) as a promising additive manufacturing technology, yet deeper understanding of the laser-material interaction is crucial to exploit the potential of the process. By simultaneous in-situ synchrotron x-ray and schlieren imaging, we probe directly the interconnected fluid dynamics of the vapour jet formed by the laser and the depression it produces in the melt pool. The combined imaging shows the formation of a stable plume over stable surface depressions, which becomes chaotic following transition to a full keyhole. We quantify process instability across several parameter sets by analysing keyhole and plume morphologies, and identify a previously unreported threshold of the energy input required for stable line scans. The effect of the powder layer and its impact on process stability is explored. These high-speed visualisations of the fluid mechanics governing LPBF enable us to identify unfavourable process dynamics associated with unwanted porosity, aiding the design of process windows at higher power and speed, and providing the potential for in-process monitoring of process stability.

Simultaneous X-ray diffraction and phase-contrast imaging for investigating material deformation mechanisms during high-rate loading.

Using a high-speed camera and an intensified charge-coupled device (ICCD), a simultaneous X-ray imaging and diffraction technique has been developed for studying dynamic material behaviors during high-rate tensile loading. A Kolsky tension bar has been used to pull samples at 1000 s(-1) and 5000 s(-1) strain-rates for super-elastic equiatomic NiTi and 1100-O series aluminium, respectively. By altering the ICCD gating time, temporal resolutions of 100 ps and 3.37 µs have been achieved in capturing the diffraction patterns of interest, thus equating to single-pulse and 22-pulse X-ray exposure. Furthermore, the sample through-thickness deformation process has been simultaneously imaged via phase-contrast imaging. It is also shown that adequate signal-to-noise ratios are achieved for the detected white-beam diffraction patterns, thereby allowing sufficient information to perform quantitative data analysis diffraction via in-house software (WBXRD_GUI). Of current interest is the ability to evaluate crystal d-spacing, texture evolution and material phase transitions, all of which will be established from experiments performed at the aforementioned elevated strain-rates.

Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation.

We present a dynamic strain field mapping method based on synchrotron X-ray digital image correlation (XDIC). Synchrotron X-ray sources are advantageous for imaging with exceptional spatial and temporal resolutions, and X-ray speckles can be produced either from surface roughness or internal inhomogeneities. Combining speckled X-ray imaging with DIC allows one to map strain fields with high resolutions. Based on experiments on void growth in Al and deformation of a granular material during Kolsky bar/gas gun loading at the Advanced Photon Source beamline 32ID, we demonstrate the feasibility of dynamic XDIC. XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation.

High speed synchrotron x-ray phase contrast imaging of dynamic material response to split Hopkinson bar loading.

The successful process of amalgamating both the time-resolved imaging capabilities present at the Advanced Photon Source beamline 32ID-B and the proficiency of high-rate loading offered by the split Hopkinson or Kolsky compression/tension bar apparatus is discussed and verification of system effectiveness is expressed via dynamic experiments on various material systems. Single particle sand interaction along with glass cracking during dynamic compression, and fiber-epoxy interfacial failure, ligament-bone debonding, and single-crystal silicon fragmentation due to dynamic tension, were imaged with 0.5 µs temporal resolution and µm-level spatial resolution. Synchrotron x-ray phase contrast imaging of said material systems being loaded with the Kolsky bar apparatus demonstratively depicts the effectiveness of the novel union between these two powerful techniques, thereby allowing for in situ analysis of the interior of the material system during high-rate loading for a variety of applications.