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1.
Phys Rev E Stat Nonlin Soft Matter Phys ; 84(5 Pt 2): 057601, 2011 Nov.
Artigo em Inglês | MEDLINE | ID: mdl-22181548

RESUMO

The problem of evaluating dissipative effects in Josephson junctions loaded by transmission lines is reexamined, for either the symmetric or the asymmetric case, with particular consideration of the time domain in which the interaction between junction and load system occurs.

2.
Phys Rev E Stat Nonlin Soft Matter Phys ; 77(5 Pt 2): 057601, 2008 May.
Artigo em Inglês | MEDLINE | ID: mdl-18643200

RESUMO

The effect of dissipation when due to the load of a transmission line coupled to a Josephson junction is reconsidered and evaluated by means of a simple direct procedure that supplies analytical expressions. The results are in good agreement with the ones previously reported in the literature. A simple criterion for testing experimental results is introduced.

3.
Phys Rev E Stat Nonlin Soft Matter Phys ; 76(4 Pt 2): 047601, 2007 Oct.
Artigo em Inglês | MEDLINE | ID: mdl-17995140

RESUMO

Tunneling processes in frustrated total internal reflection are reexamined in order to compare the results already obtained from adopting a procedure based on a transition-element analysis with those recently reported on the basis of a statistical method applied to a Brownian-like motion. A close agreement between the two approaches can be established, at optical and microwave scales, when suitable values of the involved parameters are adopted.

4.
Phys Rev E Stat Nonlin Soft Matter Phys ; 75(6 Pt 2): 066612, 2007 Jun.
Artigo em Inglês | MEDLINE | ID: mdl-17677381

RESUMO

A model based on a statistical method, as deduced from a path-integral treatment of the Brownian motion proposed by Feynman and Hibbs in 1965, demonstrates to be capable of interpreting the results of delay time measurements in frustrated total internal reflection experiments at an optical and microwave scale. A plausible description of the trajectories followed by the system inside the tunneling region, the air gap between the two dielectric prisms, is given.

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