RESUMO
The heteroepitaxy of III-V semiconductors on silicon is a promising approach for making silicon a photonic platform. Mismatches in material properties, however, present a major challenge, leading to high defect densities in the epitaxial layers and adversely affecting radiative recombination processes. However, nanostructures, such as quantum dots, have been found to grow defect-free even in a suboptimal environment. Here we present the first realization of indium phosphide quantum dots on exactly oriented Si(001), grown by metal-organic vapour-phase epitaxy. We report electrically driven single-photon emission in the red spectral region, meeting the wavelength range of silicon avalanche photodiodes' highest detection efficiency.
RESUMO
The dark exciton state strongly affects the optical and quantum optical properties of flat InP/GaInP quantum dots. The exciton intensity drops sharply compared to the biexciton with rising pulsed laser excitation power while the opposite is true with temperature. Also, the decay rate is faster for the exciton than the biexciton and the dark-to-bright state spin flip is enhanced with temperature. Furthermore, long-lived dark state related memory effects are observed in second-order cross-correlation measurements between the exciton and biexciton and have been simulated using a rate-equation model.
RESUMO
We present an electrically pumped single-photon emitter in the visible spectral range, working up to 80 K, realized using a self-assembled single InP quantum dot. We confirm that the electroluminescense is emitted from a single quantum dot by performing second-order autocorrelation measurements and show that the deviation from perfect single-photon emission is entirely related to detector limitations and background signal. Emission from both neutral and charged exciton complexes was observed with their relative intensites depending on the injection current and temperature.
