1.
Chemosphere
; 54(8): 1121-5, 2004 Feb.
Artigo
em Inglês
| MEDLINE
| ID: mdl-14664840
RESUMO
Time of flight secondary ion mass spectroscopy has been used to study the metal distribution at the soil/root interface of tree roots extracted from smelter-impacted soils. The results, augmented by scanning electron microscopy, show that the technique is capable of resolving metal distributions at the cellular level. In addition, the distribution of metals between the root plaque and the root interior may be useful in interpreting local metal transport mechanisms.