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1.
Opt Express ; 21(2): 2195-205, 2013 Jan 28.
Artigo em Inglês | MEDLINE | ID: mdl-23389200

RESUMO

Coherent XUV sources, which may operate at MHz repetition rate, could find applications in high-precision spectroscopy and for spatio-time-resolved measurements of collective electron dynamics on nanostructured surfaces. We theoretically investigate utilizing the enhanced plasmonic fields in an ordered array of gold nanoparticles for the generation of high-harmonic, extreme-ultraviolet (XUV) radiation. By optimization of the chirp of ultrashort laser pulses incident on the array, our simulations indicate a potential route towards the temporal shaping of the plasmonic near-field and, in turn, the generation of single attosecond pulses. The inherent effects of inhomogeneity of the local fields on the high-harmonic generation are analyzed and discussed. While taking the inhomogeneity into account does not affect the optimal chirp for the generation of a single attosecond pulse, the cut-off energy of the high-harmonic spectrum is enhanced by about a factor of two.


Assuntos
Ouro/química , Lasers , Iluminação/métodos , Nanopartículas Metálicas/química , Ressonância de Plasmônio de Superfície/métodos , Ouro/efeitos da radiação , Teste de Materiais , Nanopartículas Metálicas/efeitos da radiação , Espalhamento de Radiação
2.
Opt Express ; 19(3): 1954-62, 2011 Jan 31.
Artigo em Inglês | MEDLINE | ID: mdl-21369011

RESUMO

We designed, fabricated and characterized a nano-periodical highly-efficient blazed grating for extreme-ultraviolet (XUV) radiation. The grating was optimized by the rigorous coupled-wave analysis method (RCWA) and milled into the top layer of a highly-reflective mirror for IR light. The XUV diffraction efficiency was determined to be around 20% in the range from 35.5 to 79.2 nm. The effects of the nanograting on the reflectivity of the IR light and non-linear effects introduced by the nanograting have been measured and are discussed.


Assuntos
Nanotecnologia/instrumentação , Refratometria/instrumentação , Processamento de Sinais Assistido por Computador/instrumentação , Desenho de Equipamento , Análise de Falha de Equipamento , Raios Ultravioleta
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