On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology.

To fully exploit the ultimate source properties of the next-generation light sources, such as free-electron lasers (FELs) and diffraction-limited storage rings (DLSRs), the quality requirements for gratings and reflective synchrotron optics, especially mirrors, have significantly increased. These coherence-preserving optical components for high-brightness sources will feature nanoscopic shape accuracies over macroscopic length scales up to 1000 mm. To enable high efficiency in terms of photon flux, such optics will be coated with application-tailored single or multilayer coatings. Advanced thin-film fabrication of today enables the synthesis of layers on the sub-nanometre precision level over a deposition length of up to 1500 mm. Specifically dedicated metrology instrumentation of comparable accuracy has been developed to characterize such optical elements. Second-generation slope-measuring profilers like the nanometre optical component measuring machine (NOM) at the BESSY-II Optics laboratory allow the inspection of up to 1500 mm-long reflective optical components with an accuracy better than 50 nrad r.m.s. Besides measuring the shape on top of the coated mirror, it is of particular interest to characterize the internal material properties of the mirror coating, which is the domain of X-rays. Layer thickness, density and interface roughness of single and multilayer coatings are investigated by means of X-ray reflectometry. In this publication recent achievements in the field of slope measuring metrology are shown and the characterization of different types of mirror coating demonstrated. Furthermore, upcoming challenges to the inspection of ultra-precise optical components designed to be used in future FEL and DLSR beamlines are discussed.

Ultraviolet-B light induced oxidative stress: effects on antioxidant response of Spodoptera litura.

Ultraviolet light (UV-B), which emits radiation in the range of 280-315 nm, has been used worldwide in light trapping of insect pests. In this article, we test the hypothesis that one of the duration of UV-B exposure has a differential impact on oxidative stress marker enzymes in Spodoptera litura. Effect of UV-B exposure on total protein and antioxidant activities of superoxide dismutase (SOD), catalase (CAT), peroxidases (POX) and glutathione-S-transferase (GST) were investigated in S. litura. The adults were exposed to UV-B light for various time periods (0, 30, 60, 90 and 120 min). We found that exposure to UV-B light for 30 and 60 min resulted in increased activities of POX. When the exposure time lasted for 60 and 90 min, the activities of SOD remained significantly higher than the control. However, the POX, CAT and GST activity decreased to control levels at 90 and 120 min. whereas relatively long duration exposure activates the xenobiotics detoxifying enzymes like GST and POX and CAT enzymes. Longer UV-B exposure may interfere with pesticide detoxification mechanism in insects, making them more susceptible to insecticides.

Probing the valence character of O 1s-->Rydberg excited O2 by participator Auger decay measurements and partial ion yield spectroscopy following x-ray absorption.

The valence character of O 1s-->Rydberg excited O2 is investigated by means of participator Auger decay spectroscopy, performed at selected photon energies across the K-shell resonance region, and by means of partial ion yield x-ray absorption spectroscopy. For several of the excitation energies studied, the authors find substantial sigma*(4Sigmau-, 2Sigmau-) valence character being mixed with nssigma and npsigma (4Sigmau-, 2Sigmau-) Rydberg states. An experimental indication of a coupling between the channels associated with quartet and doublet ion cores is considered and discussed. New spectroscopic constants are derived for the singly ionized X 2Pig state of O2 based on the observation of at least 20 vibrational sublevels.

Doppler-free resonant Raman auger spectroscopy of Ne+ 2s2p(5)3p excited states.

Using very high resolution achieved by the Doppler-free resonant Raman Auger technique, we have resolved the lowest terms of the series of inner-valence excitations 2s2p(5)((1,3)P)np 2S, 2P, and 2D in Ne+. The measured Auger anisotropic parameters and branching ratios help to establish the assignments of these levels. The measured lifetime widths are in reasonable agreements with ab initio calculations available in the literature.