Potential-Dependent Morphology of Copper Catalysts During CO2 Electroreduction Revealed by In†Situ Atomic Force Microscopy.

Electrochemical AFM is a powerful tool for the real-space characterization of catalysts under realistic electrochemical CO2 reduction (CO2 RR) conditions. The evolution of structural features ranging from the micrometer to the atomic scale could be resolved during CO2 RR. Using Cu(100) as model surface, distinct nanoscale surface morphologies and their potential-dependent transformations from granular to smoothly curved mound-pit surfaces or structures with rectangular terraces are revealed during CO2 RR in 0.1 m KHCO3 . The density of undercoordinated copper sites during CO2 RR is shown to increase with decreasing potential. In situ atomic-scale imaging reveals specific adsorption occurring at distinct cathodic potentials impacting the observed catalyst structure. These results show the complex interrelation of the morphology, structure, defect density, applied potential, and electrolyte in copper CO2 RR catalysts.

Atomic-Scale Imprinting by Sputter Deposition of Amorphous Metallic Films.

With its ease of implementation, low cost, high throughput, and excellent feature replication accuracy, nanoimprinting is used to fabricate structures for electrical, optical, and biological applications or to modify surface properties. If ultraprecise and/or subnanometer-sized patterns are desired, nanoimprinting has shown only limited success with polymers, silica glasses, or crystalline materials. In contrast, the absence of an intrinsic length scale that would interfere with imprinting resolution enables bulk metallic glasses (BMGs) to replicate structures down to the atomic scale through thermoplastic forming (TPF). However, only a small number of BMG-forming alloys can be used for TPF-based atomic-scale imprinting. Here, we demonstrate an alternative sputter deposition-based approach for the replication of atomic-scale features that is suited for a very broad range of amorphous alloys, thereby dramatically extending the available chemistries. Additional advantages are the method's scalability, its ability to replicate a wide range of molds, its low material consumption, and the fact that the films can readily be applied onto almost any workpiece, which together open up new avenues to atomically defined surface structuring and functionalization. Our method constitutes the advancement from proof of concept to a practical and highly versatile toolbox of atomic-scale imprinting to be explored for the science and technology of atomic-scale imprinting.

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy.

Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110), respectively, were thoroughly studied. The contact potential was determined by Kelvin probe force microscopy (KPFM) and the electronic structure by scanning tunneling spectroscopy (STS). On magnesium oxide, different color centers, i.e., F(0), F(+), F(2+) and divacancies, have different effects on the contact potential. These differences enabled classification and unambiguous differentiation by KPFM. True atomic resolution shows the topography at line defects in aluminum oxide. At these domain boundaries, STS and KPFM verify F(2+)-like centers, which have been predicted by density functional theory calculations. Thus, by determining the contact potential and the electronic structure with a spatial resolution in the nanometer range, NC-AFM and STM can be successfully applied on thin oxide films beyond imaging the topography of the surface atoms.

Direct measurement of the attractive interaction forces on F0 color centers on MgO(001) by dynamic force microscopy.

Defect sites on oxide surfaces play a dominant role in surface chemistry. The direct atomistic study of these sites is important but very difficult. We have mimicked the adsorbate-defect interaction by a dynamic force microscope tip measuring the interaction with a color center (F(0)) on the MgO(001) surface. The experimental findings, complemented by density functional theory calculations, show a highly attractive adsorbate-defect interaction and a charge transfer at a critical distance.