High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy.

Unraveling local dynamic charge processes is vital for progress in diverse fields, from microelectronics to energy storage. This relies on the ability to map charge carrier motion across multiple length- and timescales and understanding how these processes interact with the inherent material heterogeneities. Towards addressing this challenge, we introduce high-speed sparse scanning Kelvin probe force microscopy, which combines sparse scanning and image reconstruction. This approach is shown to enable sub-second imaging (>3 frames per second) of nanoscale charge dynamics, representing several orders of magnitude improvement over traditional Kelvin probe force microscopy imaging rates. Bridging this improved spatiotemporal resolution with macroscale device measurements, we successfully visualize electrochemically mediated diffusion of mobile surface ions on a LaAlO3/SrTiO3 planar device. Such processes are known to impact band-alignment and charge-transfer dynamics at these heterointerfaces. Furthermore, we monitor the diffusion of oxygen vacancies at the single grain level in polycrystalline TiO2. Through temperature-dependent measurements, we identify a charge diffusion activation energy of 0.18 eV, in good agreement with previously reported values and confirmed by DFT calculations. Together, these findings highlight the effectiveness and versatility of our method in understanding ionic charge carrier motion in microelectronics or nanoscale material systems.

Mixed Triboelectric and Flexoelectric Charge Transfer at the Nanoscale.

The triboelectric effect is a ubiquitous phenomenon in which the surfaces of two materials are easily charged during the contact-separation process. Despite the widespread consequences and applications, the charging mechanisms are not sufficiently understood. Here, the authors report that, in the presence of a strain gradient, the charge transfer is a result of competition between flexoelectricity and triboelectricity, which could enhance charge transfer during triboelectric measurements when the charge transfers of both effects are in the same direction. When they are in the opposite directions, the direction and amount of charge transfer could be modulated by the competition between flexoelectric and triboelectric effects, which leads to a distinctive phenomenon, that is, the charge transfer is reversed with varying forces. The subsequent results on the electrical power output signals from the triboelectrification support the proposed mechanism. Therefore, the present study emphasizes the key role of the flexoelectric effect through experimental approaches, and suggests that both the amount and direction of charge transfer can be modulated by manipulating the mixed triboelectric and flexoelectric effects. This finding may provide important information on the triboelectric effect and can be further extended to serve as a guideline for material selection during a nanopatterned device design.

Significance of electrostatic interactions due to surface potential in piezoresponse force microscopy.

Piezoresponse force microscopy (PFM) has gradually becomes indispensable tool to investigate local piezoelectric and ferroelectric properties in diverse material systems. However, numerous reports have shown that the PFM signal can originate from several non-piezoelectric origins. Among them, because the electrostatic interaction between the AFM tip/cantilever and sample surface can be readily involved, it can be the most important factor during PFM measurement. In particular, in materials with relatively low piezoelectricity, the situation can be more significant because the PFM signals from weak piezoelectricity can be hidden or buried by the electrostatic interactions. Herein, we examined the significance of the electrostatic interactions induced by the surface potential in PFM. Using piezoelectric and non-piezoelectric materials, we examined how the surface potential-dependent electrostatic interactions can significantly affect the PFM signal. We observed that the electrostatically induced PFM amplitude have a linear relationship with the magnitude of surface potential when the instrumental noise floor is properly considered. Our results demonstrate that electrostatic interactions can be significant and their recognition and minimization are essential during PFM and other AFM-based measurements.